Patents by Inventor Cecilia T. Chen

Cecilia T. Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Managing target sound playback
    Patent number: 11928387
    Abstract: A method for controlling target sound playback. A display screen of a control device is configured to display a target sound user setting for controlling target sound playback, wherein the target sound user setting controls a stored target sound level parameter that is stored within memory of the control device. A target sound sequence is generated in accordance with the user setting. A speaker is driven with the target sound sequence. Other aspects are also described and claimed.
    Type: Grant
    Filed: June 4, 2021
    Date of Patent: March 12, 2024
    Assignee: Apple Inc.
    Inventors: Cecilia Casarini, Ian M. Fisch, Jakub Mazur, Mitchell R. Lerner, Pablo David Brazell Ruiz, Stephen W. Ryner, Jr., Tyrone T. Chen
  • System and method for testing operational transmissions of an integrated circuit
    Patent number: 6880118
    Abstract: A source synchronous test methodology and apparatus. In one embodiment, an integrated circuit (IC) configured for source synchronous I/O transactions may be a device under test (DUT) and may be mounted to a load board for testing. The load board may be electrically coupled to a test system. The test system may shift first test data into a first IC on the load board. The first chip may then transmit the first test data through a source synchronous line, or a source synchronous link having a plurality of lines, to a second IC. Second test data produced responsive to the source synchronous transmission is then shifted from the second IC to the tester. The second test data is then analyzed. The analysis may comprise comparing the second data to expected data, and/or may also comprise analyzing the second data with respect to an eye window.
    Type: Grant
    Filed: October 25, 2001
    Date of Patent: April 12, 2005
    Assignee: Sun Microsystems, Inc.
    Inventors: Cecilia T. Chen, Jyh-Ming Jong, Wai Fong, Leo Yuan, Brian L. Smith
  • I/O test methodology
    Publication number: 20030080769
    Abstract: A source synchronous test methodology and apparatus. In one embodiment, an integrated circuit (IC) configured for source synchronous I/O transactions may be a device under test (DUT) and may be mounted to a load board for testing. The load board may be electrically coupled to a test system. The test system may shift first test data into a first IC on the load board. The first chip may then transmit the first test data through a source synchronous line, or a source synchronous link having a plurality of lines, to a second IC. Second test data produced responsive to the source synchronous transmission is then shifted from the second IC to the tester. The second test data is then analyzed. The analysis may comprise comparing the second data to expected data, and/or may also comprise analyzing the second data with respect to an eye window.
    Type: Application
    Filed: October 25, 2001
    Publication date: May 1, 2003
    Inventors: Cecilia T. Chen, Jyh-Ming Jong, Wai Fong, Leo Yuan, Brian L. Smith