Patents by Inventor CEDRIC LABOUESSE

CEDRIC LABOUESSE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of converting high-level test specification language to low-level test implementation language
    Patent number: 10539609
    Abstract: A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.
    Type: Grant
    Filed: May 8, 2015
    Date of Patent: January 21, 2020
    Assignee: NXP USA, Inc.
    Inventors: Arthur Freitas, Cedric Fau, Cedric Labouesse, Philippe Soleil, Pascal Sandrez
  • TESTING OF SEMICONDUCTOR DEVICES
    Publication number: 20160161544
    Abstract: A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.
    Type: Application
    Filed: May 8, 2015
    Publication date: June 9, 2016
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: ARTHUR FREITAS, CEDRIC FAU, CEDRIC LABOUESSE, PHILIPPE SOLEIL, PASCAL SANDREZ