Patents by Inventor Cesar Talledo

Cesar Talledo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9025495
    Abstract: A system and method are disclosed for a flexible routing engine in a PCIe switch. The system may include a switch manager that is enabled, through firmware, to configure one or more routing tables associated with a switch stack of a PCIe switch. The method may include receiving a configuration transaction layer packet at the switch manager of a PCIe switch, running firmware at the switch manager to identify a desired behavior of a switch stack of the switch and updating one or more routing tables associated with switch stack.
    Type: Grant
    Filed: January 16, 2013
    Date of Patent: May 5, 2015
    Inventors: David Alan Brown, Peter Z. Onufryk, Cesar Talledo
  • Patent number: 8995302
    Abstract: A system and method are disclosed for a flexible routing engine in a PCIe switch. The system may include a switch manager that is enabled, through firmware, to configure one or more routing tables associated with a switch stack of a PCIe switch. To enable non-transparent bridging and non-standard routing, the method may include receiving a transaction layer packet at a translated routing port of a PCIe switch, and performing translation of the address and requester ID of the packet utilizing tables that are updated by the firmware of the switch manager to route the packet through the switch.
    Type: Grant
    Filed: January 16, 2013
    Date of Patent: March 31, 2015
    Assignee: PMC-Sierra US, Inc.
    Inventors: David Alan Brown, Peter Z. Onufryk, Cesar Talledo
  • Patent number: 7583087
    Abstract: In accordance with the invention, a testing circuit formed on the integrated circuit is presented. A testing circuit according to the present invention includes an input circuit coupled to a parameter testing circuit and an output driver coupled to the parameter testing circuit. Embodiments of the parameter testing circuit can include circuits for testing process, device, and circuit characteristics of the integrated circuit. Further, some embodiments of the testing circuit can be included in a scan path system where sequences of various testing circuits are included. Further, test parameters obtained from the parameter testing circuits can be utilized to adjust operating parameters of the integrated circuit.
    Type: Grant
    Filed: February 22, 2005
    Date of Patent: September 1, 2009
    Assignee: Integrated Device Technology, inc.
    Inventors: David J. Pilling, Cesar Talledo
  • Patent number: 7353345
    Abstract: A processor access module receives a data command from an agent located externally of a computing processor and performs a cache operation on a cache memory in the computing processor based on the data command. Alternatively, the processor access module receives a data command from the agent and performs a cache operation on the cache memory based on the data command to store a computer program into the cache memory. The processor access module then receives a boot command from the agent and boots the computing processor to initiate execution of the computer program.
    Type: Grant
    Filed: March 7, 2005
    Date of Patent: April 1, 2008
    Assignee: Integated Device Technology, Inc.
    Inventors: Peter Zenon Onufryk, Cesar Talledo
  • Publication number: 20060190790
    Abstract: In accordance with the invention, a testing circuit formed on the integrated circuit is presented. A testing circuit according to the present invention includes an input circuit coupled to a parameter testing circuit and an output driver coupled to the parameter testing circuit. Embodiments of the parameter testing circuit can include circuits for testing process, device, and circuit characteristics of the integrated circuit. Further, some embodiments of the testing circuit can be included in a scan path system where sequences of various testing circuits are included. Further, test parameters obtained from the parameter testing circuits can be utilized to adjust operating parameters of the integrated circuit.
    Type: Application
    Filed: February 22, 2005
    Publication date: August 24, 2006
    Inventors: David Pilling, Cesar Talledo
  • Publication number: 20050206426
    Abstract: An integrated circuit delay device includes a digital delay line configured to provide a percent-of-clock period delay to a timing signal received at an input thereof, in response to a control signal. This control signal has a value that specifies a length of the delay. A delay line control circuit is also provided. The delay line control circuit is configured to generate the control signal by counting multiple cycles of a high frequency oscillator signal (e.g., ring oscillator signal) having a period less than the clock period, over a time interval having a duration greater than the clock period.
    Type: Application
    Filed: May 23, 2005
    Publication date: September 22, 2005
    Inventors: Robert Proebsting, Cesar Talledo, David Pilling