Abstract: Systems and methods for use in introducing samples to an analytical device for single particle compositional analysis. Suitable analytical devices include, for example, an inductively coupled plasma-optical emission spectrometer. Prior to introduction to the analytical device, the sample gas is exchanged with argon gas, for example, using a gas exchange device. The analytical device may be calibrated with a liquid sample which is aerosolized prior to entry into the analytical device.

Abstract: Systems and methods for use in introducing samples to an analytical instrument. The systems and methods are adaptable to process either a liquid sample or a gaseous sample, including samples containing particle contaminants, for subsequent analysis using an analytical instrument.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Abstract: A system and method of using the system for analyzing liquid samples obtain from viscous sources. The system includes a sample delivery system, a particle counter configured to receive a liquid sample from the liquid sample delivery system, a composition analyzer configured to receive the liquid sample from the particle counter, a feed system configured to draw the liquid sample through the particle counter and subsequently inject the liquid sample into the composition analyzer; and a processor to process and analyze data from the particle counter and composition analyzer.

Abstract: A system and method of using the system for analyzing liquid samples obtain from viscous sources. The system includes a sample delivery system, a particle counter configured to receive a liquid sample from the liquid sample delivery system, a composition analyzer configured to receive the liquid sample from the particle counter, a feed system configured to draw the liquid sample through the particle counter and subsequently inject the liquid sample into the composition analyzer; and a processor to process and analyze data from the particle counter and composition analyzer.

Abstract: Certain configurations described herein are directed to mass spectrometer systems that can use a gas mixture to select and/or detect ions. In some instances, the gas mixture can be used in both a collision mode and in a reaction mode to provide improved detection limits using the same gas mixture.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Abstract: Certain configurations described herein are directed to mass spectrometer systems that can use a gas mixture to select and/or detect ions. In some instances, the gas mixture can be used in both a collision mode and in a reaction mode to provide improved detection limits using the same gas mixture.

Abstract: Methods and systems of identifying two or more elements in a single individual particle are described. In some examples, an optical emission from each of an ionized first element and an ionized second element can simultaneously be detected to identify at least a first element in a particle from a plurality of particles using the optical emission from the ionized first element, and to identify at least a second element in the particle from the plurality of particles using the optical emission from the second ionized element. The identified first element and the identified second element can be used to identify a source of the particle from a plurality of particles.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Abstract: Certain configurations described herein are directed to mass spectrometer systems that can use a gas mixture to select and/or detect ions. In some instances, the gas mixture can be used in both a collision mode and in a reaction mode to provide improved detection limits using the same gas mixture.

Abstract: Systems and methods for use in introducing samples to an analytical instrument. The systems and methods are adaptable to process either a liquid sample or a gaseous sample, including samples containing particle contaminants, for subsequent analysis using an analytical instrument.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Abstract: Certain configurations of systems comprising a cell analyzer and a mass spectrometer are described. In some embodiments, the system can be used to determine both a cell phenotype or cellular response and an amount of at least one elemental species in the cell. The phenotype or other cellular characteristic and elemental content of each cell in a cell population can be determined and correlated.

Abstract: Methods and systems of identifying two or more elements in a single individual particle are described. In some examples, an optical emission from each of an ionized first element and an ionized second element can simultaneously be detected to identify at least a first element in a particle from a plurality of particles using the optical emission from the ionized first element, and to identify at least a second element in the particle from the plurality of particles using the optical emission from the second ionized element. The identified first element and the identified second element can be used to identify a source of the particle from a plurality of particles.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Abstract: Certain configurations described herein are directed to mass spectrometer systems that can use a gas mixture to select and/or detect ions. In some instances, the gas mixture can be used in both a collision mode and in a reaction mode to provide improved detection limits using the same gas mixture.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.

Abstract: Devices, systems and methods including a spray chamber are described. In certain examples, the spray chamber may be configured with an outer chamber configured to provide tangential gas flows. In other instances, an inner tube can be positioned within the outer chamber and may comprise a plurality of microchannels. In some examples, the outer chamber may comprise dual gas inlet ports. In some instances, the spray chamber may be configured to provide tangential gas flow and laminar gas flows to prevent droplet formation on surfaces of the spray chamber. Optical emission devices, optical absorption devices and mass spectrometers using the spray chamber are also described.