Abstract: A health signature of each switching device in a control system is estimated using system parameters such as a DC-link voltage, three-phase voltages, three-phase currents, and temperature. The switching devices can be implemented as transistors, and a health signature for each transistor may be an on-state resistance or an on-state voltage of the transistors. For example, the on-state resistance for a metal-oxide-semiconductor field-effect transistor (MOSFET) functions as a health signature. Alternatively, the on-state voltage is used as a health signature for an insulated-gate bipolar transistor (IGBT). Additionally, a junction temperature is estimated for each transistor. Using the estimated health signatures and the junction temperatures, the remaining useful life of each transistor is estimated.

Abstract: The present disclosure relates to systems and methods for detecting a winding fault and the winding fault severity in a brushless direct current motor before motor failure. Methods for detecting a winding fault include time domain based sequence component analysis, fast Fourier transform analysis, or Hilbert analysis. Methods for detecting the severity of a winding fault include analysis of the standard deviation of real mean squared values determined using motor currents.

Abstract: A health signature of each switching device in a control system is estimated using system parameters such as a DC-link voltage, three-phase voltages, three-phase currents, and temperature. The switching devices can be implemented as transistors, and a health signature for each transistor may be an on-state resistance or an on-state voltage of the transistors. For example, the on-state resistance for a metal-oxide-semiconductor field-effect transistor (MOSFET) functions as a health signature. Alternatively, the on-state voltage is used as a health signature for an insulated-gate bipolar transistor (IGBT). Additionally, a junction temperature is estimated for each transistor. Using the estimated health signatures and the junction temperatures, the remaining useful life of each transistor is estimated.

Abstract: The present disclosure relates to systems and methods for detecting a winding fault and the winding fault severity in a brushless direct current motor before motor failure. Methods for detecting a winding fault include time domain based sequence component analysis, fast Fourier transform analysis, or Hilbert analysis. Methods for detecting the severity of a winding fault include analysis of the standard deviation of real mean squared values determined using motor currents.