Patents by Inventor ChaiWon YOON

ChaiWon YOON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method for detecting failure in MCU
    Patent number: 11803435
    Abstract: The disclosure relates to an MCU failure detection device and method. According to the disclosure, a device for detecting a failure in a microcontroller unit (MCU) comprises a receiver receiving first watchdog output information for determining a failure from an electronic control device, a determination unit determining whether the electronic control device has a failure based on the first watchdog output information, and upon determining that the electronic control device has the failure, transmitting a first reset signal to the electronic control device.
    Type: Grant
    Filed: July 28, 2021
    Date of Patent: October 31, 2023
    Assignee: HL Klemove Corp.
    Inventors: Jong Gyu Park, Chaiwon Yoon
  • DEVICE AND METHOD FOR DETECTING FAILURE IN MCU
    Publication number: 20220066855
    Abstract: The disclosure relates to an MCU failure detection device and method. According to the disclosure, a device for detecting a failure in a microcontroller unit (MCU) comprises a receiver receiving first watchdog output information for determining a failure from an electronic control device, a determination unit determining whether the electronic control device has a failure based on the first watchdog output information, and upon determining that the electronic control device has the failure, transmitting a first reset signal to the electronic control device.
    Type: Application
    Filed: July 28, 2021
    Publication date: March 3, 2022
    Inventors: Jong Gyu PARK, ChaiWon YOON