Patents by Inventor Chan-Hao Hsu

Chan-Hao Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method, image processing system and computer-readable recording medium for item defect inspection
    Patent number: 9811899
    Abstract: A method, image processing system, and computer-readable recording medium for item defect inspection are provided. The method is as follows. A test image and a reference image of a test item are received. A test block and a corresponding reference block are obtained from the test image and the reference image to generate a test block image and a reference block image. The test block image and the reference block image are respectively partitioned into multiple sub-blocks. All interfering sub-blocks are identified and filtered out from the test block image and the reference block image, and a shift calibration parameter is obtained accordingly. The test block in the test image is calibrated based on the shift calibration parameter to generate a calibrated test block image. The calibrated test block image and the reference block image are compared to obtain defect information of the test item corresponding to the test block.
    Type: Grant
    Filed: April 15, 2016
    Date of Patent: November 7, 2017
    Assignee: Powerchip Technology Corporation
    Inventors: Hao-Yu Chien, Chan-Hao Hsu, Tzung-Hua Ying
  • METHOD, IMAGE PROCESSING SYSTEM AND COMPUTER-READABLE RECORDING MEDIUM FOR ITEM DEFECT INSPECTION
    Publication number: 20170186144
    Abstract: A method, image processing system, and computer-readable recording medium for item defect inspection are provided. The method is as follows. A test image and a reference image of a test item are received. A test block and a corresponding reference block are obtained from the test image and the reference image to generate a test block image and a reference block image. The test block image and the reference block image are respectively partitioned into multiple sub-blocks. All interfering sub-blocks are identified and filtered out from the test block image and the reference block image, and a shift calibration parameter is obtained accordingly. The test block in the test image is calibrated based on the shift calibration parameter to generate a calibrated test block image. The calibrated test block image and the reference block image are compared to obtain defect information of the test item corresponding to the test block.
    Type: Application
    Filed: April 15, 2016
    Publication date: June 29, 2017
    Inventors: Hao-Yu Chien, Chan-Hao Hsu, Tzung-Hua Ying