Abstract: A reduced pin count (RPC) device includes an electrical circuitry in a package with uniformly distributed leads, a subset of the leads being electrically disconnected form the circuitry. A contactor pin block with sockets corresponding to the uniformly distributed leads has the sockets corresponding to the leads with electrical connections filled with test pins suitable for contacting respective leads, and the sockets corresponding to the electrically disconnected leads voided of test pins. Dummy plugs are inserted into the voided sockets to block the sockets and prevent accidental insertions of test pins.

Abstract: A system comprises: a contactor having a first surface, a second surface, a first hole, a second hole parallel to the first hole, and a third hole parallel to the first hole; a first signal pin held in the first hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor; a first short ground pin held in the second hole of the contactor, extending to at least the second surface of the contactor, and extending within the first surface of the contactor; and a ground pin held in the third hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor.

Abstract: A reduced pin count (RPC) device includes an electrical circuitry in a package with uniformly distributed leads, a subset of the leads being electrically disconnected form the circuitry. A contactor pin block with sockets corresponding to the uniformly distributed leads has the sockets corresponding to the leads with electrical connections filled with test pins suitable for contacting respective leads, and the sockets corresponding to the electrically disconnected leads voided of test pins. Dummy plugs are inserted into the voided sockets to block the sockets and prevent accidental insertions of test pins.

Abstract: A reduced pin count (RPC) device includes an electrical circuitry in a package with uniformly distributed leads, a subset of the leads being electrically disconnected form the circuitry. A contactor pin block with sockets corresponding to the uniformly distributed leads has the sockets corresponding to the leads with electrical connections filled with test pins suitable for contacting respective leads, and the sockets corresponding to the electrically disconnected leads voided of test pins. Dummy plugs are inserted into the voided sockets to block the sockets and prevent accidental insertions of test pins.

Abstract: A system comprises: a contactor having a first surface, a second surface, a first hole, a second hole parallel to the first hole, and a third hole parallel to the first hole; a first signal pin held in the first hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor; a first short ground pin held in the second hole of the contactor, extending to at least the second surface of the contactor, and extending within the first surface of the contactor; and a ground pin held in the third hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor.

Abstract: A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a split plunger member comprised of an upper split plunger part separated from a lower split plunger part separated by a diagonal cut reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the upper split plunger part and the second end of the internal cavity. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first split plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second split plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity.

Abstract: A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one rectangular cavity formed in the plunger member with a movable cylindrical bearing in the cavity that applies a slight transverse force to the plunger member ensuring good electrical contact between the plunger and the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end.

Abstract: A reduced pin count (RPC) device includes an electrical circuitry in a package with uniformly distributed leads, a subset of the leads being electrically disconnected form the circuitry. A contactor pin block with sockets corresponding to the uniformly distributed leads has the sockets corresponding to the leads with electrical connections filled with test pins suitable for contacting respective leads, and the sockets corresponding to the electrically disconnected leads voided of test pins. Dummy plugs are inserted into the voided sockets to block the sockets and prevent accidental insertions of test pins.

Abstract: A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one cavity formed in the plunger member with a conductive bearing in the cavity in electrical contact with the plunger and with the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity.

Abstract: A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. Three or more conductive bearings are positioned in the internal cavity in contact with the first plunger member and the spring member. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity.

Abstract: A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one rectangular cavity formed in the plunger member with a movable cylindrical bearing in the cavity that applies a slight transverse force to the plunger member ensuring good electrical contact between the plunger and the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end.

Abstract: A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one cavity formed in the plunger member with a conductive bearing in the cavity in electrical contact with the plunger and with the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity.

Abstract: A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. Three or more conductive bearings are positioned in the internal cavity in contact with the first plunger member and the spring member. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity.

Abstract: A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a split plunger member comprised of an upper split plunger part separated from a lower split plunger part separated by a diagonal cut reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the upper split plunger part and the second end of the internal cavity. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first split plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second split plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity.

Abstract: A spring biased contact pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a lower plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the lower plunger member and the upper end of the internal cavity. A high electrical resistance spacer member is positioned in the internal cavity in contact with the lower plunger member and the spring member. Spring force exerted through the spacer member urges the lower plunger member into electrical contact with the barrel wall. A method of transmitting electricity through an electrical contact assembly includes urging a plunger member against the wall of a barrel member in which it is reciprocally mounted with a high electrical resistance member.

Abstract: A spring biased contact pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a lower plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the lower plunger member and the upper end of the internal cavity. A high electrical resistance spacer member is positioned in the internal cavity in contact with the lower plunger member and the spring member. Spring force exerted through the spacer member urges the lower plunger member into electrical contact with the barrel wall. A method of transmitting electricity through an electrical contact assembly includes urging a plunger member against the wall of a barrel member in which it is reciprocally mounted with a high electrical resistance member.

Abstract: A probe tip may include a plurality of spaced projections adapted to contact the input/output lands of an integrated circuit device.

Abstract: An intra-oral stabilisation device has an upper tray (101), a lower tray a lower tray (201), and at least two spacers (217) to provide a spacing between the anterior portions of the upper and lower trays. Spacers (217) provide a spacing between anterior portions of the trays, and are positioned between corresponding posterior portions of the trays. Engagement features (301) are provided for engaging undersides of the posterior portions of the upper tray with upper sides of the posterior potions of the lower tray, and minimise lateral movement of the trays relative to one another once the trays are engaged with one another. In an alternative embodiment, the device may have only the lower tray, and may have a locator (219) for stabilising an endotracheal tube 401 relative to the lower tray. The upper or lower tray can be used to stabilise fracture segments of a fractured jaw.

Abstract: The invention is a bare floor cleaning appliance provided with a foot pedal for raising and lowering the suction nozzle while simultaneously energizing and de-energizing the independent drive motor powering a horizontal axis rotary agitator. The foot pedal is depressed once to lower the suction nozzle to a position closest to the floor surface and the horizontal rotary agitator is energized to clean the floor surface. Suction from the motor-fan assembly is used to pick up dirt and used cleaning solution. The foot pedal is depressed one more time to raise the suction nozzle from the floor surface and de-energize the horizontal rotary agitator. In this mode, suction from the motor-fan assembly is used to pick up dry objects including dirt. The foot pedal operates the switch for energizing and de-energizing the independent electric motor by rotating a mode indicator operably connected to the foot pedal.

Abstract: A floor care appliance is provided for cleaning bare surfaces such as tile, marble, linoleum and wood. The floor care appliance includes an accessory hose, telescoping wand and accessory tools for cleaning bare surfaces. A latch having a latch cover is provided for connecting the telescoping wand to the handgrip portion of the accessory hose. The latch and latch cover arrangement could also be utilized for connecting the accessory tools such as a accessory suction nozzle and grout tool to the telescoping wand.