Abstract: An IC includes testing circuitry including a Test Access Port (TAP) controller and Segment-Insertion-Bit circuits (SIBs) arranged in multiple hierarchy levels. Some of the SIBs are connected to hardware units, and some of the SIBs are root-SIBs that connect between neighbor hierarchy levels. A test bus runs in a daisy-chained loop path starting at the TAP controller, passing via at least some of the SIBs and ending at the TAP controller. Each root-SIB has an Open state and a Closed state. The TAP controller, for a selected subset of the hardware units that are to be tested, selects one or more root-SIBs that, when set to the Open state, make the selected subset of hardware units reachable by the test bus, and sends via the daisy-chained test bus a data stream comprising one or more instructions that set two or more of the selected root-SIBs to the Open state.

Abstract: Sensor data is obtained regarding an environment around a guidance device. A model of the environment is generated based on the data. The model is mapped at least to an input/output touch surface of the guidance device. Tactile output is provided to a user of the guidance device via the input/output touch surface based at least on the mapping. Other output based on the model may also be provided. The guidance device may include a variety of different components such as sensors that obtain data regarding the environment, input/output mechanisms for receiving input from and/or providing input to the user, processing units and/or other components for generating the model and/or mapping the model to various input/output mechanisms, and so on. Additionally, the guidance device may cooperate and/or communicate with a variety of different electronic devices that have one or more such components in order to perform such functions.

Abstract: Sensor data is obtained regarding an environment around a guidance device. A model of the environment is generated based on the data. The model is mapped at least to an input/output touch surface of the guidance device. Tactile output is provided to a user of the guidance device via the input/output touch surface based at least on the mapping. Other output based on the model may also be provided. The guidance device may include a variety of different components such as sensors that obtain data regarding the environment, input/output mechanisms for receiving input from and/or providing input to the user, processing units and/or other components for generating the model and/or mapping the model to various input/output mechanisms, and so on. Additionally, the guidance device may cooperate and/or communicate with a variety of different electronic devices that have one or more such components in order to perform such functions.

Abstract: Sensor data is obtained regarding an environment around a guidance device. A model of the environment is generated based on the data. The model is mapped at least to an input/output touch surface of the guidance device. Tactile output is provided to a user of the guidance device via the input/output touch surface based at least on the mapping. Other output based on the model may also be provided. The guidance device may include a variety of different components such as sensors that obtain data regarding the environment, input/output mechanisms for receiving input from and/or providing input to the user, processing units and/or other components for generating the model and/or mapping the model to various input/output mechanisms, and so on. Additionally, the guidance device may cooperate and/or communicate with a variety of different electronic devices that have one or more such components in order to perform such functions.

Abstract: Sensor data is obtained regarding an environment around a guidance device. A model of the environment is generated based on the data. The model is mapped at least to an input/output touch surface of the guidance device. Tactile output is provided to a user of the guidance device via the input/output touch surface based at least on the mapping. Other output based on the model may also be provided. The guidance device may include a variety of different components such as sensors that obtain data regarding the environment, input/output mechanisms for receiving input from and/or providing input to the user, processing units and/or other components for generating the model and/or mapping the model to various input/output mechanisms, and so on. Additionally, the guidance device may cooperate and/or communicate with a variety of different electronic devices that have one or more such components in order to perform such functions.

Abstract: Sensor data is obtained regarding an environment around a guidance device. A model of the environment is generated based on the data. The model is mapped at least to an input/output touch surface of the guidance device. Tactile output is provided to a user of the guidance device via the input/output touch surface based at least on the mapping. Other output based on the model may also be provided. The guidance device may include a variety of different components such as sensors that obtain data regarding the environment, input/output mechanisms for receiving input from and/or providing input to the user, processing units and/or other components for generating the model and/or mapping the model to various input/output mechanisms, and so on. Additionally, the guidance device may cooperate and/or communicate with a variety of different electronic devices that have one or more such components in order to perform such functions.

Abstract: A device for enhancing sexual pleasure includes an appliance, a memory for storing code for operating the appliance, and a processor for executing the code, all housed in a housing configured for insertion, as such or inside a condom, into a sexual organ. The appliance could be a stimulator or a sensor. The stimulator could be a speaker, a heater, a thermoelectric cooler, a source of electromagnetic radiation such as visible light, a source of electrical power or a mechanism for pressurizing a pressurizable medium. The sensor could be a thermometer, a microphone, a camera or an accelerometer.

Abstract: The present invention implements a mechanism using an inter-connection layer to couple a plurality of integrated circuit devices to a printed circuit board, thereby eliminating the need for sockets to hold the integrated circuit devices on the printed circuit board. The mechanism of the present invention is operative for integrated circuit devices packaged in a ball grid array, a quad flat pack or a leadless quad flat pack. The present invention also provides a mechanism to efficiently transfer a plurality of integrated circuit devices from an integrated circuit device delivery tray to a burn-in board in a single process without requiring an autoloader, resulting in increased transfer reliability and both cost and space savings.

Abstract: The present invention implements a mechanism using an inter-connection layer to couple a plurality of integrated circuit devices to a printed circuit board, thereby eliminating the need for sockets to hold the integrated circuit devices on the printed circuit board. The mechanism of the present invention is operative for integrated circuit devices packaged in a ball grid array, a quad flat pack or a leadless quad flat pack. The present invention also provides a mechanism to efficiently transfer a plurality of integrated circuit devices from an integrated circuit device delivery tray to a burn-in board in a single process without requiring an autoloader, resulting in increased transfer reliability and both cost and space savings.

Abstract: Hardware cells inside of an IC device, such as in a processor circuit, for characterization that replace functional flip-flops that capture inputs or drive outputs in the device. The cells are circuits that are used, in conjunction with a software method, to generate test programs for testing exact I/O transitions for timing measurements at various operating conditions.

Abstract: Hardware cells inside of an IC device, such as in a processor circuit, for characterization that replace functional flip-flops that capture inputs or drive outputs in the device. The cells are circuits that are used, in conjunction with a software method, to generate test programs for testing exact I/O transitions for timing measurements at various operating conditions.

Abstract: Hardware cells inside of an IC device, such as in a processor circuit, for characterization that replace functional flip-flops that capture inputs or drive outputs in the device. The cells are circuits that are used, in conjunction with a software method, to generate test programs for testing exact I/O transitions for timing measurements at various operating conditions.

Abstract: An analog BIST (Built-in Self-Test) module for a load board in a test system for testing Integrated Chips (IC) and other devices-under-test (DUTs). Components of the test module perform test setup, transmission of analog test signals to a DUT, capture of analog and digital test data from the DUT, and on-board analysis of the test data using DSPs without sending the test data to a tester. Modules may be add-on boards to load boards an contain one or more processors and multiple components to test DUTs in parallel, significantly decreasing test and analysis times of a test system such as a Very Low Cost Tester (VLCT).

Abstract: The invention includes a design for device design-for-test and a burn-in-board that reduce the number of external components per device on the board. Inputs to the I/Os of a device from input means are inverted between pairs of output pins. A single resister is coupled between an output that is true (e.g., not inverted) and an output that is inverted. Thus, instead of using one or more resistors per I/O from the DUT, a single resister can be coupled between inverted and non-inverted outputs.

Abstract: An analog BIST (Built-in Self-Test) module for a load board in a test system for testing Integrated Chips (IC) and other devices-under-test (DUTs). Components of the test module perform test setup, transmission of analog test signals to a DUT, capture of analog and digital test data from the DUT, and on-board analysis of the test data using DSPs without sending the test data to a tester. Modules may be add-on boards to load boards an contain one or more processors and multiple components to test DUTs in parallel, significantly decreasing test and analysis times of a test system such as a Very Low Cost Tester (VLCT).

Abstract: The invention provides tester load board shields for attachment to tester load boards. The shields of the invention protect from physical damage and electromagnetic interference. A preferred embodiment of a tester load board shield of the invention is disclosed in which a disc and outer rim of conductive metal such as aluminum or aluminum alloy are configured to accept a tester load board. The tester load board shield has holes to align with a selected tester load board for attachment of the shield thereto. Stanchions are provided to facilitate attachment of the Loadboard with shield to automatic test equipment known in the arts while a tester load board, also familiar in the arts, is fastened to the shield. Another embodiment of a tester load board shield is disclosed in the shape of annulus configured to contain a tester load board within an outer rim planar surface and inner rim.

Abstract: The invention includes a design for device design-for-test and a burn-in-board that reduce the number of external components per device on the board. Inputs to the I/Os of a device from input means are inverted between pairs of output pins. A single resister is coupled between an output that is true (e.g., not inverted) and an output that is inverted. Thus, instead of using one or more resistors per I/O from the DUT, a single resister can be coupled between inverted and non-inverted outputs.

Abstract: Hardware cells inside of an IC device, such as in a processor circuit, for characterization that replace functional flip-flops that capture inputs or drive outputs in the device. The cells are circuits that are used, in conjunction with a software method, to generate test programs for testing exact I/O transitions for timing measurements at various operating conditions.

Abstract: The invention provides tester load board shields (10, 40) for attachment to tester load boards. The shields (10, 40) of the invention protect from physical damage and electromagnetic interference. A preferred embodiment of a tester load board shield (10) of the invention is disclosed in which a disc (12) and outer rim (14) of conductive metal such as aluminum or aluminum alloy are configured to accept a tester load board. The tester load board shield (10) has holes (18) to align with a selected tester load board for attachment of the shield (10) thereto. Stanchions (22) are provided to facilitate attachment of the Loadboard with shield (10) to automatic test equipment known in the arts while a tester load board, also familiar in the arts, is fastened to the shield (10). Another embodiment of a tester load board shield (40) is disclosed in the shape of annulus (42) configured to contain a tester load board within an outer rim (44), planar surface (46), and inner rim (50).

Abstract: In a method and system for testing a device, a tester provides a first plurality of test signals to the device. A test module includes a plurality of logic circuits operable to concurrently execute a plurality of test programs. The concurrent execution of the plurality of test programs generates a second plurality of test signals. The plurality of logic circuits control a plurality of switches in which each one of the plurality of switches is selectively controlled to provide one of the first plurality of test signals and the second plurality of test signals to/from the device.