Patents by Inventor Chandra Pinjala

Chandra Pinjala has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180292983
    Abstract: Computer-implemented methods for mapping sensor tags of assets to input ports of an analytic process are disclosed. In an embodiment, a processor receives a selection by a user of an analytic process to run on a plurality of assets, automatically maps the analytic input ports of the selected analytic process to sensor tags of each of the plurality of assets that have matching tag names, and determines which analytic input ports have not been fully mapped. The processor then provides a map by asset option and a map by tag option to the user device, receives a selection of the map by asset option, provides an unmapped assets list including at least one asset that is not fully mapped and a list of tag alias names, and then receives a selection from the user device of an asset from the unmapped assets list along with selections of tag alias names mapped to the unmapped analytic input ports of the selected analytic process.
    Type: Application
    Filed: April 5, 2017
    Publication date: October 11, 2018
    Inventors: Raneath Omega NOR, Chandra PINJALA, Chad ACKERMAN, Alok GUPTA, Yogini PARKHI, Fred SCHULTS, Ashley FERGUSON
  • Patent number: 9785526
    Abstract: A method for performing tests using automated test equipment (ATE) is presented. The method comprises obtaining information concerning a test class using a graphical user interface. Further, it comprises generating a first header file automatically, wherein the first header file comprises the information concerning the test class. Next, it comprises importing the first header file into a test plan operable to execute using a tester operating system wherein the test plan comprises instances of the test class. It further comprises, generating a second header file from the first header file automatically, wherein the second header file is a header file for the test class. The method also comprises validating the test plan using the tester operating system. Finally, the method comprises loading the test plan and a compiled module onto the tester operating system for execution, wherein the compiled module is a compiled translation of the test class.
    Type: Grant
    Filed: April 30, 2013
    Date of Patent: October 10, 2017
    Assignee: ADVANTEST CORPORATION
    Inventors: Mark Elston, Ankan Pramanick, Leon Chen, Chandra Pinjala
  • Patent number: 9274911
    Abstract: A method for using shared pins in a concurrent test execution environment is disclosed. The method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE) in a way so that resources can be shared between the test flows. The method comprises determining if any of a plurality of splits used by a first test contains at least one resource that is shared, wherein the first test and a second test are sequenced for execution in two separate concurrently executing test flows. The method further comprises determining if the first test should execute before the second test if the split is associated with resources required by both the second and first tests. Finally the method comprises reserving the split containing the at least one shared resource for access by the first test before beginning execution of the first test.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: March 1, 2016
    Assignee: ADVANTEST CORPORATION
    Inventors: Mark Elston, Harsanjeet Singh, Ankan Pramanick, Leon Lee Chen, Hironori Maeda, Chandra Pinjala, Ramachandran Krishnaswamy
  • Publication number: 20140324378
    Abstract: A method for performing tests using automated test equipment (ATE) is presented. The method comprises obtaining information concerning a test class using a graphical user interface. Further, it comprises generating a first header file automatically, wherein the first header file comprises the information concerning the test class. Next, it comprises importing the first header file into a test plan operable to execute using a tester operating system wherein the test plan comprises instances of the test class. It further comprises, generating a second header file from the first header file automatically, wherein the second header file is a header file for the test class. The method also comprises validating the test plan using the tester operating system. Finally, the method comprises loading the test plan and a compiled module onto the tester operating system for execution, wherein the compiled module is a compiled translation of the test class.
    Type: Application
    Filed: April 30, 2013
    Publication date: October 30, 2014
    Applicant: Advantest Corporation
    Inventors: Mark ELSTON, Ankan PRAMANICK, Leon CHEN, Chandra PINJALA
  • Publication number: 20140237291
    Abstract: A method for using shared pins in a concurrent test execution environment is disclosed. The method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE) in a way so that resources can be shared between the test flows. The method comprises determining if any of a plurality of splits used by a first test contains at least one resource that is shared, wherein the first test and a second test are sequenced for execution in two separate concurrently executing test flows. The method further comprises determining if the first test should execute before the second test if the split is associated with resources required by both the second and first tests. Finally the method comprises reserving the split containing the at least one shared resource for access by the first test before beginning execution of the first test.
    Type: Application
    Filed: February 21, 2013
    Publication date: August 21, 2014
    Applicant: ADVANTEST CORPORATION
    Inventors: Mark Elston, Harsanjeet Singh, Ankan Pramanick, Leon Lee Chen, Hironori Maeda, Chandra Pinjala, Ramachandran Krishnaswamy