Patents by Inventor Chandru Haralakere Puttaswamy

Chandru Haralakere Puttaswamy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11041789
    Abstract: The present invention relates to an integrated system and method for in-situ 3-axis scanning and detecting defects in a CFRP composite (150) being loaded under static and cyclic test conditions. The system comprises a test system integrated with (10) a scanning system (20) that comprises a probe assembly (52) to generate eddy current on the surface of the CFRP composite (150) mounted on the test system, and a 3D scanner assembly (60) for movement of the probe assembly (50) over the entire surface area of the CFRP composite (150) along X-axis, Y-axis and Z-axis. An operator console (70) is connected to the test system and the scanning system (20) for controlling (3) mechanical test process in the test system and for controlling 3-dimensional movement of the probe assembly (52) along X-axis, Y-axis and Z-axis in a synchronous manner.
    Type: Grant
    Filed: June 29, 2017
    Date of Patent: June 22, 2021
    Assignee: Illinois Tool Works Inc.
    Inventors: Pradeep K, Chandru Haralakere Puttaswamy, Murali Mohan, Sunder Ramasubbu, Somayya Ammanagi
  • Publication number: 20200182758
    Abstract: The present invention relates to an integrated system and method for in-situ 3-axis scanning and detecting defects in a CFRP composite (150) being loaded under static and cyclic test conditions. The system comprises a test system integrated with (10) a scanning system (20) that comprises a probe assembly (52) to generate eddy current on the surface of the CFRP composite (150) mounted on the test system, and a 3D scanner assembly (60) for movement of the probe assembly (50) over the entire surface area of the CFRP composite (150) along X-axis, Y-axis and Z-axis. An operator console (70) is connected to the test system and the scanning system (20) for controlling (3) mechanical test process in the test system and for controlling 3-dimensional movement of the probe assembly (52) along X-axis, Y-axis and Z-axis in a synchronous manner.
    Type: Application
    Filed: June 29, 2017
    Publication date: June 11, 2020
    Inventors: Pradeep K, Chandru Haralakere Puttaswamy, Murali Mohan, Sunder Ramasubbu, Somayya Ammanagi