Abstract: A semiconductor device includes a bottom electrode via, a top electrode via over the bottom electrode via, a memory cell between the bottom electrode via and the top electrode via, a first dielectric layer over the memory cell, and a second dielectric layer over the first dielectric layer, and a via structure separated from the memory cell. A height of the via structure is substantially equal to a sum of a height of the bottom electrode via, a height of the memory cell, and a height of the top electrode via. The first dielectric layer partially surrounds a first portion of the via structure, and the second dielectric layer partially surrounds a second portion of the via structure. A height of the second portion of the via structure is greater than a height of the first portion of the via structure.

Abstract: A semiconductor device includes a semiconductor layer. A gate structure is disposed over the semiconductor layer. A spacer is disposed on a sidewall of the gate structure. A height of the spacer is greater than a height of the gate structure. A liner is disposed on the gate structure and on the spacer. The spacer and the liner have different material compositions.

Abstract: The present disclosure describes a structure with a conductive plate and a method for forming the structure. The structure includes a gate structure disposed on a diffusion region of a substrate, a protective layer in contact with the diffusion region and covering a sidewall of the gate structure and a portion of a top surface of the gate structure, and a first insulating layer in contact with the gate structure and the protective layer. The structure further includes a conductive plate in contact with the first insulating layer, where a first portion of the conductive plate laterally extends over a horizontal portion of the protective layer, and where a second portion of the conductive plate extends over a sidewall portion of the protective layer covering the sidewall of the gate structure. The structure further includes a second insulating layer in contact with the conductive plate.

Abstract: A transistor including a channel layer including an oxide semiconductor material and methods of making the same. The transistor includes a channel layer having a first oxide semiconductor layer having a first oxygen concentration, a second oxide semiconductor layer having a second oxygen concentration and a third oxide semiconductor layer having a third oxygen concentration. The second oxide semiconductor layer is located between the first semiconductor oxide layer and the third oxide semiconductor layer. The second oxygen concentration is lower than the first oxygen concentration and the third oxygen concentration.

Abstract: A portable electronic device including a first body, a second body, and a hinge mechanism is provided. The second body is connected to the first body through the hinge mechanism, and the hinge mechanism has a basis axis located at the first body and a rotation axis located at a lower end of the second body. When the second body rotates with respect to the first body, the rotation axis slides along an arc shaped path with respect to the basis axis to increase or decrease a distance between the rotation axis and the basis axis and increase or decrease a distance between the lower end of the second body and a back end of the first body.

Abstract: A memory cell includes a thin film transistor over a semiconductor substrate, the thin film transistor including: a memory film contacting a word line; and an oxide semiconductor (OS) layer contacting a source line and a bit line, wherein the memory film is disposed between the OS layer and the word line, wherein the source line and the bit line each comprise a first conductive material touching the OS layer, and wherein the first conductive material has a work function less than 4.6. The memory cell further includes a dielectric material separating the source line and the bit line.

Abstract: A transistor comprises a colored light shielding layer over the semiconductor layer thereof. The colored light shielding layer reduces exposure of the semiconductor layer to radiation having a wavelength of about 10 nanometers (nm) to about 400 nm. The colored light shielding layer may have a white, black, red, yellow, or gray color. The colored light shielding layer can be formed from a metal oxide film, a p-type oxide semiconductor, or a perovskite. The colored light shielding layer reduces defects that may be generated in the semiconductor layer due to UV light exposure during the manufacturing process, improving device performance and reliability.

Abstract: A device includes a substrate. A first channel region of a first transistor overlies the substrate and a source/drain region is in contact with the first channel region. The source/drain region is adjacent to the first channel region along a first direction, and the source/drain region has a first surface opposite the substrate and side surfaces extending from the first surface. A dielectric fin structure is adjacent to the source/drain region along a second direction that is transverse to the first direction, and the dielectric fin structure has an upper surface, a lower surface, and an intermediate surface that is disposed between the upper and lower surfaces. A silicide layer is disposed on the first surface and the side surfaces of the source/drain region and on the intermediate surface of the dielectric fin structure.

Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: Thermal stability of a transistor is improved in different ways. An interfacial layer between a source/drain electrode and a semiconductor layer is formed from a material having a higher bond dissociation energy than indium oxide. Alternatively, the interfacial layer is formed from a metal-doped oxide semiconductor material. As another option, a metal layer or a metal oxide layer is formed between the source/drain electrode and the interfacial layer.

Abstract: A semiconductor device includes a FEOL structure and a BEOL structure. The BEOL structure is formed over the FEOL structure and includes a barrier dielectric layer, a transistor and a first barrier. The barrier dielectric layer has an upper surface and a lower surface. The transistor is partially formed in the barrier dielectric layer and includes an electrode element, and the electrode element has a first lateral surface, wherein the first lateral surface extends from the upper surface toward the lower surface. The first barrier covers the entirety of the first lateral surface of the electrode element.

Abstract: The present disclosure relates generally to rapid-release pharmaceutical dosage unit tablets containing small molecule API medicines. In some instances the API is an inhibitor of Ras proteins, such as K-Ras, H-Ras, and N-Ras, that have a G12C mutation. Such tablets also contain a disintegrant and an excipient. More specifically, the present disclosure relates to pharmaceutical dosage unit tablets containing divarasib, or a pharmaceutically acceptable salt thereof, an extragranular disintegrant, and an extragranular excipient, and to processes for preparing the tablets from granules formed by dry granulation.

Abstract: A container for containing food or liquid is provided. The container includes a body portion, a lid and an attachment. The lid is detachably disposed on the body portion. The attachment includes a magnetic attraction member and a connecting structure. The magnetic attraction member is independent from the lid and adapted to be magnetically connected to a mobile electronic device. The connecting structure is disposed between the magnetic attraction member and the container for selectively fixing the magnetic attraction member at a first position or a second position. At least a portion of the connecting structure is fixed to the container.

Abstract: The present disclosure relates a ferroelectric field-effect transistor (FeFET) device. The FeFET device includes a ferroelectric structure having a first side and a second side. A gate structure is disposed along the first side of the ferroelectric structure, and an oxide semiconductor is disposed along the second side of the ferroelectric structure. The oxide semiconductor has a first semiconductor type. A source region and a drain region are disposed on the oxide semiconductor. The gate structure is laterally between the source region and the drain region. A polarization enhancement structure is arranged on the oxide semiconductor between the source region and the drain region. The polarization enhancement structure includes a semiconductor material or an oxide semiconductor material having a second semiconductor type that is different than the first semiconductor type.

Abstract: The present disclosure provides an electronic device, and the electronic device includes a first substrate, a first circuit layer, a touch sensing element, a touch sensing circuit, a bio-feature sensing element, a second substrate, a second circuit layer, a bio-feature sensing circuit, a plurality of pixels and a blocking layer. The touch sensing element overlaps with the first substrate and includes a plurality of touch sensing electrodes. The touch sensing circuit is coupled to the touch sensing element through the first circuit layer. The second circuit layer is overlapped with the second substrate. The bio-feature sensing circuit is coupled to the bio-feature sensing element through the second circuit layer, wherein a distance between the second side edge of the second substrate and the bio-feature sensing circuit is less than a distance between the first side edge of the substrate and the touch sensing circuit.

Abstract: A reduced interfacial defect density and low contact resistance can be provided for a thin film transistor by using a compositionally-modulated capping layer. A stack including a gate electrode, a gate dielectric layer, an active layer including a semiconducting metal oxide material, an in-process capping layer including a dielectric metal oxide material can be formed over a substrate. A dielectric material layer can be formed, and a source cavity and a drain cavity can be formed through the dielectric material layer. Exposed portions of the in-process capping layer can be converted into conductive material portions to provide a compositionally-modulated capping layer, which includes a first conductive capping material portion, the second conductive capping material portion, and a dielectric capping material portion.

Abstract: A method of forming a semiconductor structure includes following operations. A memory layer is formed over the first gate electrode. A channel layer is formed over the memory layer. A first SUT treatment is performed. A second dielectric layer is formed over the memory layer and the channel layer. A source electrode and a drain electrode are formed in the second dielectric layer. A temperature of the first SUT treatment is less than approximately 400° C.

Abstract: A field-effect transistor (FET), selectively switchable between first and second states, includes: source and drain regions and a channel region disposed therebetween; a gate arranged to selectively receive a bias voltage which switches the FET between the first and second states; a memory structure between the gate and the channel region, structure including a first portion which is anti-ferroelectric and a second portion which is ferroelectric, both portions being polarized in a first direction when the FET is in the first state; and a depolarization dielectric layer disposed proximate to the memory structure. When the FET is set to the first state, the depolarization dielectric layer destabilizes a polarization of the second portion of the memory structure while maintaining a polarization of the first portion.

Abstract: A method for forming a semiconductor structure includes following operations. A substrate is received. The substrate includes a first dielectric layer and a conducive layer formed in the first dielectric layer. A ferroelectric layer is formed over the first dielectric layer and the conductive layer. A metal oxide semiconductor layer is formed over the ferroelectric layer. An SUT treatment is performed. A temperature of the SUT treatment is less than approximately 400° C.