Abstract: A control method for a non-volatile memory is provided. After the non-volatile memory is enabled, a judging step is performed to judge whether the non-volatile memory enters a read mode, a program mode or an erase mode. If the judging result indicates that the non-volatile memory enters the read mode, the program mode or the erase mode, a worst threshold voltage of plural reference cells of the non-volatile memory is searched. Then, at least one of a control voltage for read action, a control voltage for program verify and a control voltage for erase verify is determined. Then, a read action, a program action or an erase action is performed on plural data cells of the non-volatile memory.

Abstract: A programming method of a non-volatile memory cell is provided. The non-volatile memory cell includes a memory transistor. Firstly, a current limiter is provided, and the current limiter is connected between a drain terminal of the memory transistor and a ground terminal. Then, a program voltage is provided to a source terminal of the memory transistor, and a control signal is provided to a gate terminal of the memory transistor. In a first time period of a program action, the control signal is gradually decreased from a first voltage value, so that the memory transistor is firstly turned off and then slightly turned on. When the memory transistor is turned on, plural hot electrons are injected into a charge trapping layer of the memory transistor.

Abstract: A load cell touch control device includes a touch panel, a plurality of load cells and a control unit. The touch panel receives a stress applied thereon. The load cells are implemented in the touch panel to detect respective components of the stress received by the touch panel. The control unit is connected to the load cells in order to receive magnitudes of the respective components to thereby calculate a magnitude, position and motion trace of the stress on the touch panel based on the respective components detected by the load cells in the touch panel.

Abstract: A multi-dimension detector with half bridge load cells, which includes an analog to digital converter (ADC), a plurality of half bridge load cells, an analog multiplexer and a central processing unit (CPU). The CPU controls the analog multiplexer to form a plurality of full bridge load cells by selecting either two of the half bridge load cells and detect a plurality of measures corresponding to an object. The ADC converts analog signals corresponding to the plurality of measures into digital signals. The CPU determines all dimension values of the object according to the plurality of measures corresponding to the digital signals.

Abstract: A load cell touch control device includes a touch panel, a plurality of load cells and a control unit. The touch panel receives a stress applied thereon. The load cells are implemented in the touch panel to detect respective components of the stress received by the touch panel. The control unit is connected to the load cells in order to receive magnitudes of the respective components to thereby calculate a magnitude, position and motion trace of the stress on the touch panel based on the respective components detected by the load cells in the touch panel.

Abstract: A multi-dimension detector with half bridge load cells, which includes an analog to digital converter (ADC), a plurality of half bridge load cells, a multiplexer and a central processing unit (CPU). The CPU controls the multiplexer to form a plurality of full bridge load cells by selecting either-two of the half bridge load cells and detect a plurality of measures corresponding to an object. The ADC converts analog signals corresponding to the plurality of measures into digital signals. The CPU determines all dimension values of the object according to the plurality of measures corresponding to the digital signals.