Patents by Inventor Chang Gi MIN

Chang Gi MIN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Display driving apparatus
    Patent number: 11961443
    Abstract: The present disclosure discloses a display driving apparatus. The display driving apparatus of the present disclosure may be configured to drive a source signal in a state optimized for a panel load of a display panel.
    Type: Grant
    Filed: December 19, 2022
    Date of Patent: April 16, 2024
    Assignee: LX SEMICON CO., LTD.
    Inventors: Dong Hun Lee, Won Kim, Young Tae Kim, Taiming Piao, Chang Gi Min
  • Display driver including crack resistance measurement circuit and method of measuring crack of display panel
    Patent number: 11776439
    Abstract: A display driver including a crack resistance measurement circuit according to one embodiment of the present disclosure includes a crack resistance measurement circuit connected to a crack resistance circuit of a display panel to measure a crack resistance of the crack resistance circuit, wherein the crack resistance measurement circuit includes a reference resistance generation circuit configured to generate a reference resistance using at least two resistors connected in series and at least two switches connected to correspond to the at least two resistors, a comparator configured to compare a magnitude of the crack resistance with a magnitude of the reference resistance and output a resistance comparison result, and a circuit controller configured to output a reference resistance control signal for controlling the at least two switches according to the resistance comparison result.
    Type: Grant
    Filed: January 3, 2022
    Date of Patent: October 3, 2023
    Assignee: LX SEMICON CO., LTD.
    Inventors: Chang Gi Min, Young Tae Kim, Seung Oh Ko, Young Bok Kim
  • DISPLAY DRIVING APPARATUS
    Publication number: 20230206805
    Abstract: The present disclosure discloses a display driving apparatus. The display driving apparatus of the present disclosure may be configured to drive a source signal in a state optimized for a panel load of a display panel.
    Type: Application
    Filed: December 19, 2022
    Publication date: June 29, 2023
    Applicant: LX Semicon Co., Ltd.
    Inventors: Dong Hun LEE, Won KIM, Young Tae KIM, Taiming PIAO, Chang Gi MIN
  • DISPLAY DRIVER INCLUDING CRACK RESISTANCE MEASUREMENT CIRCUIT AND METHOD OF MEASURING CRACK OF DISPLAY PANEL
    Publication number: 20220215783
    Abstract: A display driver including a crack resistance measurement circuit according to one embodiment of the present disclosure includes a crack resistance measurement circuit connected to a crack resistance circuit of a display panel to measure a crack resistance of the crack resistance circuit, wherein the crack resistance measurement circuit includes a reference resistance generation circuit configured to generate a reference resistance using at least two resistors connected in series and at least two switches connected to correspond to the at least two resistors, a comparator configured to compare a magnitude of the crack resistance with a magnitude of the reference resistance and output a resistance comparison result, and a circuit controller configured to output a reference resistance control signal for controlling the at least two switches according to the resistance comparison result.
    Type: Application
    Filed: January 3, 2022
    Publication date: July 7, 2022
    Inventors: Chang Gi MIN, Young Tae KIM, Seung Oh KO, Young Bok KIM
  • System and method for controlling semiconductor manufacturing facility, method of manufacturing integrated circuit using the system and method, and method of manufacturing processor using the system and method
    Patent number: 10553464
    Abstract: A method for controlling a semiconductor manufacturing facility includes measuring output change amounts of differential pressure sensors in the facility when pressure conditions change by a number of fans. The fans are then classified into different groups and subgroups and control sequences of the subgroups are determined based on the change amounts. Difference values are then calculated, and a control signal is generated to adjust the rotation speed of the fans.
    Type: Grant
    Filed: April 11, 2018
    Date of Patent: February 4, 2020
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jae Won Jeong, Yi Jin, Chang Gi Min, Jin Woo Lee, Seok Heo, Yong Won Choi, Yun Jong Choi
  • SYSTEM AND METHOD FOR CONTROLLING SEMICONDUCTOR MANUFACTURING FACILITY, METHOD OF MANUFACTURING INTEGRATED CIRCUIT USING THE SYSTEM AND METHOD, AND METHOD OF MANUFACTURING PROCESSOR USING THE SYSTEM AND METHOD
    Publication number: 20190088515
    Abstract: A method for controlling a semiconductor manufacturing facility includes measuring output change amounts of differential pressure sensors in the facility when pressure conditions change by a number of fans. The fans are then classified into different groups and subgroups and control sequences of the subgroups are determined based on the change amounts. Difference values are then calculated, and a control signal is generated to adjust the rotation speed of the fans.
    Type: Application
    Filed: April 11, 2018
    Publication date: March 21, 2019
    Inventors: Jae Won JEONG, Yi JIN, Chang Gi MIN, Jin Woo LEE, Seok HEO, Yong Won CHOI, Yun Jong CHOI