Abstract: A light-emitting device includes a first semiconductor layer; a semiconductor pillar formed on the first semiconductor layer, including a second semiconductor layer and an active layer, wherein the semiconductor pillar comprises an outmost periphery; a first contact layer formed on the first semiconductor layer and including a first contact portion and a first extending portion, wherein the first extending portion continuously surrounds an entirety of the outmost periphery of the semiconductor pillar and the first contact portion; a second contact layer formed on the second semiconductor layer; a first insulating layer including multiple first openings exposing the first contact layer and multiple second openings exposing the second contact layer; a first electrode contact layer connected to the first contact portion through the multiple first openings and covering all of the first contact layer; a second electrode contact layer connected to the second contact layer through the multiple second openings.

Abstract: An automatic testing equipment, an automatic testing system, an a method for controlling automatic testing thereof are disclosed. The automatic testing equipment is used for receiving a control signal to test a durability of a connecting port of a device under test (DUT). The automatic testing equipment includes a testing platform, a testing unit, and a power control unit. The testing platform is used for disposing the DUT. The testing unit includes a main body, an assembly unit, and a height adjustment unit. The assembly unit is used for assembling a test connector. The height adjustment unit is connected with the main body and works with the assembly unit to adjust a height of the assembly unit. The power control unit drives the testing unit to test the connecting port via the test connector after receiving the control signal.

Abstract: An automatic testing equipment, an automatic testing system, an a method for controlling automatic testing thereof are disclosed. The automatic testing equipment is used for receiving a control signal to test a durability of a connecting port of a device under test (DUT). The automatic testing equipment includes a testing platform, a testing unit, and a power control unit. The testing platform is used for disposing the DUT. The testing unit includes a main body, an assembly unit, and a height adjustment unit. The assembly unit is used for assembling a test connector. The height adjustment unit is connected with the main body and works with the assembly unit to adjust a height of the assembly unit. The power control unit drives the testing unit to test the connecting port via the test connector after receiving the control signal.