Abstract: Disclosed is an apparatus and method for plasma processing, which facilitates to constantly control a RF voltage supplied to a substrate supporting member by precisely detecting an inductive RF voltage induced to the substrate supporting member for a plasma, the apparatus comprising: a substrate supporting member for supporting a substrate, installed in a reaction room of a processing chamber; a RF generator for supplying a RF voltage to the substrate supporting member so as to form plasma in the reaction room; and a matching device for matching impedance of the RF voltage to be supplied to the substrate supporting member from the RF generator, wherein the matching device comprises: a matching unit for matching the impedance of RF voltage; and an inductive RF detecting unit which an inductive RF detecting voltage by removing noise frequency elements except a waveform of the RF voltage from a waveform of an inductive RF voltage induced to the substrate supporting member, and supplies the detected inductive RF

Abstract: An electrostatic chuck for an apparatus for treating a substrate includes a body; an insulating plate attached onto a top surface of the body, wherein the substrate is disposed on the insulating plate; an electrode in the insulating plate; a temperature controlling unit including a heating unit and a cooling unit under the electrode and in the insulating plate; and a thermal conduction unit disposed between the electrode and the temperature controlling unit.

Abstract: Disclosed is an apparatus and method for plasma processing, which facilitates to constantly control a RF voltage supplied to a substrate supporting member by precisely detecting an inductive RF voltage induced to the substrate supporting member for a plasma, the apparatus comprising: a substrate supporting member for supporting a substrate, installed in a reaction room of a processing chamber; a RF generator for supplying a RF voltage to the substrate supporting member so as to form plasma in the reaction room; and a matching device for matching impedance of the RF voltage to be supplied to the substrate supporting member from the RF generator, wherein the matching device comprises: a matching unit for matching the impedance of RF voltage; and an inductive RF detecting unit which an inductive RF detecting voltage by removing noise frequency elements except a waveform of the RF voltage from a waveform of an inductive RF voltage induced to the substrate supporting member, and supplies the detected inductive RF

Abstract: An electrostatic chucking apparatus and a method for manufacturing the same is disclosed, which is capable of enabling the increase of lifetime of an electrostatic chuck and realizing a uniform temperature gradient in an entire substrate by preventing an insulating material from being etched, the electrostatic chucking apparatus comprising a base member; and an electrostatic chuck, loaded onto the base member, for chucking a substrate by an electrostatic force, wherein the electrostatic chuck comprises an insulating member formed on the base member and provided with a plurality of first insulating sheets of aluminum nitride; a heater for heating the substrate, the heater positioned among the plurality of first insulating sheets; a direct current electrode formed on at least one first insulating sheet provided above the heater among the plurality of first insulating sheets, the DC electrode electrically connected with a direct current power source; and an insulator etch stopping layer, formed of aluminum oxide

Abstract: An electrostatic chuck for an apparatus for treating a substrate includes a body; an insulating plate attached onto a top surface of the body, wherein the substrate is disposed on the insulating plate; an electrode in the insulating plate; a temperature controlling unit including a heating unit and a cooling unit under the electrode and in the insulating plate; and a thermal conduction unit disposed between the electrode and the temperature controlling unit.