Patents by Inventor Chang-Su Sim

Chang-Su Sim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9754678
    Abstract: A method of testing a semiconductor integrated circuit including a one-time programmable (OTP) memory device is provided. A program command is transferred from a tester to the OTP memory device. Programming and a programming verification are performed with respect to OTP memory cells in the OTP memory device in response to the program command. The OTP device generates accumulated verification result signal by accumulating program verification results with respect to the OTP memory cells. The accumulated verification result signal is transferred from the OTP memory device to the tester.
    Type: Grant
    Filed: April 15, 2016
    Date of Patent: September 5, 2017
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Do-Hoon Byun, Chang-Su Sim, Na-Rae Hong
  • Publication number: 20170040067
    Abstract: A method of testing a semiconductor integrated circuit including a one-time programmable (OTP) memory device is provided. A program command is transferred from a tester to the OTP memory device. Programming and a programming verification are performed with respect to OTP memory cells in the OTP memory device in response to the program command. The OTP device generates accumulated verification result signal by accumulating program verification results with respect to the OTP memory cells. The accumulated verification result signal is transferred from the OTP memory device to the tester.
    Type: Application
    Filed: April 15, 2016
    Publication date: February 9, 2017
    Inventors: Do-Hoon Byun, Chang-Su Sim, Na-Rae Hong