Patents by Inventor Chang-Suk Cho

Chang-Suk Cho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11929389
    Abstract: An integrated circuit device includes a lower electrode, an upper electrode, and a dielectric layer structure between the lower electrode and the upper electrode, the dielectric layer structure including a first surface facing the lower electrode and a second surface facing the upper electrode. The dielectric layer structure includes a first dielectric layer including a first dielectric material and a plurality of grains extending from the first surface to the second surface and a second dielectric layer including a second dielectric material and surrounding a portion of a sidewall of each of the plurality of grains of the first dielectric layer in a level lower than the second surface. The second dielectric material includes a material having bandgap energy which is higher than bandgap energy of the first dielectric material.
    Type: Grant
    Filed: May 19, 2021
    Date of Patent: March 12, 2024
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Youn-soo Kim, Seung-min Ryu, Chang-su Woo, Hyung-suk Jung, Kyu-ho Cho, Youn-joung Cho
  • Patent number: 9342889
    Abstract: A 3D measurement system and method therefor having improved precision can be provided by projecting a pattern using a grid pattern or a chessboard grid pattern and performing interpolation based on a method for measuring differences in illuminance. A 3D measurement system includes a coordinate value calculation unit for calculating 3D coordinate values from pattern image information captured using a predetermined pattern, and a depth value calculation unit for calculating a depth value at a first position from N pieces of illuminance image information captured using lighting devices installed at N different locations.
    Type: Grant
    Filed: September 27, 2012
    Date of Patent: May 17, 2016
    Assignees: WIPCO CO., LTD
    Inventor: Chang-Suk Cho
  • Publication number: 20150187081
    Abstract: A 3D measurement system and method therefor having improved precision can be provided by projecting a pattern using a grid pattern or a chessboard grid pattern and performing interpolation based on a method for measuring differences in illuminance. A 3D measurement system includes a coordinate value calculation unit for calculating 3D coordinate values from pattern image information captured using a predetermined pattern, and a depth value calculation unit for calculating a depth value at a first position from N pieces of illuminance image information captured using lighting devices installed at N different locations.
    Type: Application
    Filed: September 27, 2012
    Publication date: July 2, 2015
    Inventor: Chang-Suk Cho