Abstract: Various embodiments of the present invention relate to a method for operating a complex panel, including a display panel and at least one sensing panel, and provided are the method for operating a complex panel and an electronic device therefor, the method comprising: identifying a scanning period of the display panel; and calibrating the sensing panel by using first location calibration information when the identified scanning period belongs to a first range, and calibrating the sensing panel by using second location calibration information when the scanning period belongs to a second range. Therefore, a location can be smoothly detected by enabling an adaptive variance so as to optimize object detection conditions of at least one sensing panel included together according to an operation environment of the display panel, and ensuring the reliability of the electronic device.

Abstract: A method for controlling output of image data and an electronic device supporting the same are provided. The method includes defining a frame memory by a partial memory area corresponding to a size of image data corresponding to one image frame to be output to a partial area of a display panel or dividing the frame memory into a plurality of memory areas, writing, in the plurality of memory areas, image data corresponding to successive image frames of image content, accessing the plurality of memory areas to read the written image data, and outputting the read image data to the display panel divided into a plurality of panel areas.

Abstract: A liquid crystal display is capable of detecting a failure of a gate driver, and a method of testing the same are provided. The liquid crystal display includes a liquid crystal display panel on which liquid crystal cells connected to thin film transistors (TFTs) located at crossings between gate lines and data lines are formed, a data driver that drives the data lines of the liquid crystal display panel, and a gate driver which includes first to nth stages (n is a natural number larger than 1) formed on the liquid crystal display panel that generates normal scan signals for turning on the TFTs in a normal mode, and that generates test scan signals for turning off the TFTs in a test mode.

Abstract: A method for fabricating a polysilicon silicon liquid crystal display device is disclosed in which a contact hole connecting source and drain electrodes to an active layer is formed without a stepped portion. An insulation layer containing a porous silicon nitride layer is formed. Wet etching the contact hole through the porous silicon nitride layer and an underlying silicon oxide layer does not generate the stepped portion as the etch rates of the porous silicon nitride layer and the silicon oxide layer are the same. Because the stepped portion is not generated at a contact hole, disconnection of source and drain electrodes formed in the contact hole is prevented, thereby preventing deterioration of the liquid crystal display device from occurring.

Abstract: A liquid crystal display is capable of detecting a failure of a gate driver, and a method of testing the same are provided. The liquid crystal display includes a liquid crystal display panel on which liquid crystal cells connected to thin film transistors (TFTs) located at crossings between gate lines and data lines are formed, a data driver that drives the data lines of the liquid crystal display panel, and a gate driver which includes first to nth stages (n is a natural number larger than 1) formed on the liquid crystal display panel that generates normal scan signals for turning on the TFTs in a normal mode, and that generates test scan signals for turning off the TFTs in a test mode.

Abstract: A method for fabricating a polysilicon silicon liquid crystal display device is disclosed in which a contact hole connecting source and drain electrodes to an active layer is formed without a stepped portion. An insulation layer containing a porous silicon nitride layer is formed. Wet etching the contact hole through the porous silicon nitride layer and an underlying silicon oxide layer does not generate the stepped portion as the etch rates of the porous silicon nitride layer and the silicon oxide layer are the same. Because the stepped portion is not generated at a contact hole, disconnection of source and drain electrodes formed in the contact hole is prevented, thereby preventing deterioration of the liquid crystal display device from occurring.