Patents by Inventor Changliang Zhang

Changliang Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8198737
    Abstract: A method of forming a wire bond in a semiconductor device includes forming a first bump of a first composition proximate to a probe mark on a bond pad. A second bump of the first composition is formed adjacent to the first bump such that the first and second bumps are formed away from the probe mark. A wire of a second composition that is harder than the first composition is attached on top of the first and second bumps to form an interconnection.
    Type: Grant
    Filed: July 28, 2009
    Date of Patent: June 12, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Changliang Zhang, Yingwei Jiang, Zhijie Wang, Wei Xiao
  • Publication number: 20120082976
    Abstract: Disclosed are a novel method of screening for insulin secretion-potentiating agents as well as means for performing such screening. The means include a DNA encoding fluorescent-labeled Epac2 comprising two different DNAs encoding two different fluorescent proteins which emit fluorescent light with wavelength differing from each other and a DNA encoding Epac2 which are fused together in-frame, and the cells transformed with the DNA. Also disclosed is a method of screening insulin secretion-potentiating agents comprising bringing a candidate compound into contact with cells transformed with the said DNA, and detecting whether the compound binds to Epac2.
    Type: Application
    Filed: April 15, 2010
    Publication date: April 5, 2012
    Applicant: KOBE UNIVERSITY
    Inventors: Susumu Seino, Changliang Zhang, Megumi Kato, Tadao Shibazaki
  • Publication number: 20100314754
    Abstract: A method of forming a wire bond in a semiconductor device includes forming a first bump of a first composition proximate to a probe mark on a bond pad. A second bump of the first composition is formed adjacent to the first bump such that the first and second bumps are formed away from the probe mark. A wire of a second composition that is harder than the first composition is attached on top of the first and second bumps to form an interconnection.
    Type: Application
    Filed: July 28, 2009
    Publication date: December 16, 2010
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Changliang ZHANG, Yingwei Jiang, Zhijie Wang, Wei Xiao