Abstract: A method for phase contrasting-correlation spectroscopy: converting an incident linearly polarized light into two polarized components (polarized divergent and convergent components, wherein the polarized divergent component is orthogonal to the polarized convergent component), focusing each of the polarized divergent component and the polarized convergent component into a focal plane, thereby producing two focus planes constituting a reference focus (RF) plane and a sample focus (SF) plane; placing a sample at the SF plane and ambient conditions of the sample at the RF plane, resulting in a phase shift between the two polarized components; reconstituting the two phase-shifted polarized components into a phase-shifted linearly polarized light; detecting the phase-shifted linearly polarized light; calculating phase and intensity of the sample from the phase-shifted linearly polarized light; establishing an autocorrelation of phase and intensity of the phase-shifted linearly polarized light; and generating corr

Abstract: A method of obtaining a measurement signal representative of the particle size distributions in nanocrystal suspensions that includes a step of providing a first light beam along a first axis to a first micro-retarder array to generate polarization wavefront shaped light. The shaped light is applied to an objective configured to focus two orthogonally polarized components of the polarization wavefront shaped light to produce first and second axially offset foci along the first axis. A sample having particles in suspension is disposed in one foci to produce a measurement optical signal having phase and intensity values corresponding to at least some of the particles in suspension. The method also includes determining intensity and quantitative phase information as a function of time based on the optical signals.

Abstract: Apparatus and methods for controlling heating of an objective in a linescanning sequencing system to improve resolution are disclosed. In accordance with a first implementation, an apparatus includes or comprises a beam source for providing input radiation and a beam shaping group including or comprising one or more optical elements positioned to receive the input radiation from the beam source, and to perform beam shaping on the input radiation to form a shaped beam. The apparatus further including or comprising an objective positioned to receive the shaped beam and to transform the shaped beam into a probe beam and configured to provide the probe beam to a focal plane of the objective for optically probing a sample. The beam shaping group is configured to adjust one or more properties of the shaped beam over time to generally uniformly heat the objective over a region of incidence for the shaped beam.

Abstract: A method for imaging a sample, wherein the sample changes a polarization state of light as a function of position, wherein the method includes changing a polarization state of a purely polarized light of an incident light striking a micro-retarder array, thereby inducing a changed polarization state of the polarization state. The micro-retarder array is placed in a rear conjugate focal plane of a microscope. The method additionally includes projecting the changed polarization state of the polarization state into an object plane of the microscope containing the sample.

Abstract: A system including a first micro-retarder array, wherein the first micro-retarder array is configured to convert a purely polarized light of an incident light into two components. The system additionally includes an optical device, wherein the optical device is configured to collimate the two components to two foci planes. Moreover, the system includes a second micro-retarder array, wherein the second micro-retarder array is configured to combine a set of two components of the incident light, thereby producing a second purely polarized light. Further the system includes a detector, wherein the detector is configured to receive the second purely polarized light.

Abstract: A method for imaging a sample, wherein the sample changes a polarization state of light as a function of position, wherein the method includes changing a polarization state of a purely polarized light of an incident light striking a micro-retarder array, thereby inducing a changed polarization state of the polarization state. The micro-retarder array is placed in a rear conjugate focal plane of a microscope. The method additionally includes projecting the changed polarization state of the polarization state into an object plane of the microscope containing the sample.

Abstract: A system including a first micro-retarder array, wherein the first micro-retarder array is configured to convert a purely polarized light of an incident light into two components. The system additionally includes an optical device, wherein the optical device is configured to collimate the two components to two foci planes. Moreover, the system includes a second micro-retarder array, wherein the second micro-retarder array is configured to combine a set of two components of the incident light, thereby producing a second purely polarized light. Further the system includes a detector, wherein the detector is configured to receive the second purely polarized light.

Abstract: A method for imaging a sample, wherein the sample changes a polarization state of light as a function of position, wherein the method includes changing a polarization state of a purely polarized light of an incident light striking a micro-retarder array, thereby inducing a changed polarization state of the polarization state. The micro-retarder array is placed in a rear conjugate focal plane of a microscope. The method additionally includes projecting the changed polarization state of the polarization state into an object plane of the microscope containing the sample.

Abstract: A system including a first micro-retarder array, wherein the first micro-retarder array is configured to convert a purely polarized light of an incident light into two components. The system additionally includes an optical device, wherein the optical device is configured to collimate the two components to two foci planes. Moreover, the system includes a second micro-retarder array, wherein the second micro-retarder array is configured to combine a set of two components of the incident light, thereby producing a second purely polarized light. Further the system includes a detector, wherein the detector is configured to receive the second purely polarized light.

Abstract: A method for imaging a sample, wherein the sample changes a polarization state of light as a function of position, wherein the method includes changing a polarization state of a purely polarized light of an incident light striking a miro-retarder array, thereby inducing a changed polarization state of the polarization state. The micro-retarder array is placed in a rear conjugate focal plane of a microscope. The method additionally includes projecting the changed polarization state of the polarization state into an object plane of the microscope containing the sample.

Abstract: A system including a first micro-retarder array, wherein the first micro-retarder array is configured to convert a purely polarized light of an incident light into two components. The system additionally includes an optical device, wherein the optical device is configured to collimate the two components to two foci planes. Moreover, the system includes a second micro-retarder array, wherein the second micro-retarder array is configured to combine a set of two components of the incident light, thereby producing a second purely polarized light. Further the system includes a detector, wherein the detector is configured to receive the second purely polarized light.