Abstract: A wireless network device includes an antenna array and a lobe interleaver. The antenna array includes a plurality of antenna elements with different squint angles. The lobe interleaver is coupled to the antenna elements and has a plurality of output lobe ports. The lobe interleaver divides and interleaves the radio signal of the antenna array with the same phase and the same power to generate a plurality of lobes with different squint angles. The number of lobes is twice the number of antenna elements.

Abstract: A wireless network device includes an antenna array and a lobe interleaver. The antenna array includes a plurality of antenna elements with different squint angles. The lobe interleaver is coupled to the antenna elements and has a plurality of output lobe ports. The lobe interleaver divides and interleaves the radio signal of the antenna array with the same phase and the same power to generate a plurality of lobes with different squint angles. The number of lobes is twice the number of antenna elements.

Abstract: A system in package (SIP) batch test method and an SIP batch test system are applicable to an unpartitioned circuit module having a plurality of devices under test (DUTs). The circuit module is loaded in a loading module of the batch test system after probing test and molding operations. A test module of the batch test system is electrically coupled to at least two DUTs. At least two testers provide two different signal tests. A signal transmission controller controls signal transmission paths between the testers and the test module. A test controller controls the two testers and the test module to test the electrically coupled DUTs in parallel and record test results of the DUTs in configuration data. Finally, the circuit module is partitioned, so as to classify the DUTs according to the test results.