Patents by Inventor Chao-Qing Wang

Chao-Qing Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Capacitance sensing structure
    Patent number: 7884624
    Abstract: A capacitance sensing structure includes a substrate, a sensing electrode layer, at least one stack layer and a conductive body. The sensing electrode layer is formed on or in the substrate. The stack layer is formed on the sensing electrode layer. The conductive body is disposed over and corresponding to the sensing electrode layer and the stack layer.
    Type: Grant
    Filed: December 14, 2007
    Date of Patent: February 8, 2011
    Assignee: Delta Electronics, Inc.
    Inventors: Horng-Jou Wang, Hsieh-Shen Hsieh, Chao-Jui Liang, Cheng-Chang Lee, Chao-Qing Wang, Zong-Ting Yuan, Huang-Kun Chen, Tai-Kang Shing
  • CAPACITANCE SENSING STRUCTURE
    Publication number: 20080150554
    Abstract: A capacitance sensing structure includes a substrate, a sensing electrode layer, at least one stack layer and a conductive body. The sensing electrode layer is formed on or in the substrate. The stack layer is formed on the sensing electrode layer. The conductive body is disposed over and corresponding to the sensing electrode layer and the stack layer.
    Type: Application
    Filed: December 14, 2007
    Publication date: June 26, 2008
    Applicant: DELTA ELECTRONICS, INC.
    Inventors: Horng-Jou WANG, Hsieh-Shen Hsieh, Chao-Jui Liang, Cheng-Chang Lee, Chao-Qing Wang, Zong-Ting Yuan, Huang-Kun Chen, Tai-Kang Shing