Abstract: An image processor and an image combination method thereof are provided. The image processor includes a processing unit for performing the image combination method, and a storing unit for storing an original image and an output image. The image combination method includes the following steps. First, the original image is received from the storing unit. A first processing procedure scales down the original image to generate a first image. A second processing procedure crops the original image to generate a second image. The first image and the second image are combined to form and then be outputted the output image. Accordingly, the image processor and the image combination method are capable of providing the overview and local detailed content of the original image at the same time.

Abstract: To estimate a far-field signature of a seismic source having plural source elements, seismic receivers are provided to receive signals from the seismic source elements of the seismic source. Seismic receivers are dynamically associated with different seismic source elements over time, and the far-field signature of the seismic source is computed according to the measurement data taken by the seismic receivers.

Abstract: A meter apparatus having three-phase judgment function includes a control unit, a multimeter measurement unit electrically connected to the control unit, a three-phase judgment unit electrically connected to the control unit, a first measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit, a second measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit, and a third measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit.

Abstract: A clamp meter with multipoint measurement includes a current-measuring unit, an analog-to-digital converting unit, and a measuring-position judgment unit. The current-measuring unit includes a plurality of current-measuring positions calibrated according to the measuring-position judgment unit. The current-measuring unit measures the current of the current-measuring position judged by the measuring-position judgment unit.

Abstract: A meter apparatus having three-phase judgment function includes a control unit, a multimeter measurement unit electrically connected to the control unit, a three-phase judgment unit electrically connected to the control unit, a first measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit, a second measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit, and a third measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit.

Abstract: A multimeter with filtered measurement mode is disclosed. The multimeter includes a signal conditioning circuit, a low-pass filter, a microprocessor, a measurement circuit, a root-mean-square (RMS) converter, a display unit, and an external rotary switch. The signal conditioning circuit receives a control signal to select an operation mode of the multimeter. The low-pass filter is electrically connected to the signal conditioning circuit. The microprocessor is electrically connected to the signal conditioning circuit. The measurement circuit is electrically connected to the microprocessor and the RMS converter to measure a signal outputted from the RMS converter. The display unit is electrically connected to the microprocessor and the measurement circuit. Also, the external rotary switch is optionally connected to the microprocessor. Whereby rotating the external rotary switch to generate the control signal and perform a low-pass filtering mode to communicate the low-pass filter with the RMS converter.

Abstract: A clamp meter with multipoint measurement includes a current-measuring unit, an analog-to-digital converting unit, and a measuring-position judgment unit. The current-measuring unit includes a plurality of current-measuring positions calibrated according to the measuring-position judgment unit. The current-measuring unit measures the current of the current-measuring position judged by the measuring-position judgment unit.

Abstract: A measuring apparatus for capacitor is applied to a charging power source and a capacitor to be measured. The measuring apparatus for capacitor includes a microcontroller unit, an analog-digital converter unit, a charging-side switch unit, a charging-side resistor unit, a discharging-side switch unit and a discharging-side resistor unit. The capacitor to be measured is charged and discharged by the charging-side switch unit and the discharging-side switch unit controlled by the microcontroller unit. The charging and discharging voltage and time variation of the capacitor to be measured are measured by the analog-digital converter unit to calculate the capacitance value of the capacitor to be measured.

Abstract: A probe tip coating structure for test probes includes a probe tip body and a coating element, and the probe tip body includes a rod and a probe head integrally formed a front end of the rod, and the external diameter of the rod is not greater than the external diameter of a base of the probe head, and the coating element is coated on the rod and forms a continuing section securely combined with the exterior of the rod, and a seat is coupled to an end of the continuing section and provided for assembling the test probe, such that the coating element is formed on the probe tip, and the external diameter of the coating element is close to that of the probe tip and the coating element can be securely combined with the probe tip without the risk of getting loosened or falling apart.

Abstract: A test probe with a dual switching probe tip includes an insulating sheath, a conductive wire and a complex probe tip, and an end of the conductive wire is passed and connected into the insulating sheath. The complex probe tip includes a connecting section, and a first measuring head and a second measuring head extended in opposite directions from both ends of the connecting section respectively, and the first and second measuring heads are measuring heads of two different specifications and electrically connected with each other, and the connecting section is selectively combined with the insulating sheath, and the first measuring head is exposed from the insulating sheath or accommodated in the insulating sheath and electrically connected to the conductive wire. The probe tip can be switched and installed at the insulating sheath to extend the using life of the test probe or meet the requirements of fitting different specifications.

Abstract: A measuring apparatus for capacitor is applied to a charging power source and a capacitor to be measured. The measuring apparatus for capacitor includes a microcontroller unit, an analog-digital converter unit, a charging-side switch unit, a charging-side resistor unit, a discharging-side switch unit and a discharging-side resistor unit. The capacitor to be measured is charged and discharged by the charging-side switch unit and the discharging-side switch unit controlled by the microcontroller unit. The charging and discharging voltage and time variation of the capacitor to be measured are measured by the analog-digital converter unit to calculate the capacitance value of the capacitor to be measured.

Abstract: A clamp meter for measuring voltage and current simultaneously includes a microcontroller unit, a current-side analog-digital converter unit electrically connected to the microcontroller unit and a current-measuring unit, a voltage-side analog-digital converter unit electrically connected to the microcontroller unit and a voltage-measuring unit. By providing dedicated analog-digital converter unit to the current-measuring unit and the voltage-measuring unit, the clamp meter is capable of measuring voltage and current precisely and simultaneously.

Abstract: The test probe assembly of the invention is used for an electric meter such as a multimeter or the like. The electric meter has a main body. The test probe assembly includes a pair of insulated rods, a pair of probe tips and a pair of leads. The insulated rods are separately provided with two corresponding engaging portions, so that the insulated rods can be combined or detached. One end of each probe tip is fixed in one of the insulated rods and the other ends are protrudent. The leads connect between the insulated rods and main body. The combination or detachment of the test probe assembly may form a variety of configurations for different measured objects.

Abstract: The multimeter of the invention includes main body, a current sensor and a flexible tube. The main body is provided with a display. The current sensor is electrically connected to the main body via a wire. The flexible tube is connected between the main body and current sensor. And the wire is accommodated in the flexible tube. Therefore, the current sensor can be adjusted to any direction, angle and position.

Abstract: A multimeter with filtered measurement mode is disclosed. The multimeter includes a signal conditioning circuit, a low-pass filter, a microprocessor, a measurement circuit, a root-mean-square (RMS) converter, a display unit, and an external rotary switch. The signal conditioning circuit receives a control signal to select an operation mode of the multimeter. The low-pass filter is electrically connected to the signal conditioning circuit. The microprocessor is electrically connected to the signal conditioning circuit. The measurement circuit is electrically connected to the microprocessor and the RMS converter to measure a signal outputted from the RMS converter. The display unit is electrically connected to the microprocessor and the measurement circuit. Also, the external rotary switch is optionally connected to the microprocessor. Whereby rotating the external rotary switch to generate the control signal and perform a low-pass filtering mode to communicate the low-pass filter with the RMS converter.