Patents by Inventor Chao-Wen Chung

Chao-Wen Chung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated circuit test vehicle
    Patent number: 6534968
    Abstract: An apparatus for detecting failures in electrical connections between an integrated circuit package substrate and a circuit board. The substrate has substrate electrical contacts that are electrically connected one to another in first sets in a first region of the substrate. The circuit board has circuit board electrical contacts that are electrically connected one to another in second sets in a second region of the circuit board. The substrate electrical contacts align with and make electrical contact with the circuit board electrical contacts. The first region of the substrate aligns with the second region of the circuit board when the substrate electrical contacts make electrical contact with the circuit board electrical contacts. The first sets of substrate electrical contacts form chains of electrical contacts with the second sets of circuit board electrical contacts. The chains of electrical contacts loop back and forth electrically between the substrate and the circuit board.
    Type: Grant
    Filed: August 10, 2001
    Date of Patent: March 18, 2003
    Assignee: LSI Logic Corporation
    Inventors: Leah M. Miller, Anand Govind, Zafer Kutlu, Chao-Wen Chung, Aritharan Thurairajaratnam