Abstract: A wafer image capturing apparatus, including a loud/unload system, at least one imaging station and a conveying device, are provided. The loud/unload system contains a plurality of wafers. The at least one imaging includes a platform and an image capturing device. The conveying device includes a movable component for moving the wafer to a platform of at least one imaging station. An image capturing device is configured to capture an image of the wafer. A method for image capturing is also provided, including: operating a conveying device to pick a wafer from a load/unload system and move the wafer to at least one imaging station; and operating at least one image capturing device to capture an image from above or below the imaging station. Thus, the flexibility and efficiency of wafer image capturing can be improved.

Abstract: An image calibration method for imaging system is provided, including: specifying a detection area located in an image capture scope and the detection area having a unit to be tested; capturing a detection image respectively when the detection area is located in at least two locations within the image capture scope; combining the plurality of detection images and calculating to obtain a calibration figure; and applying the calibration figure to a captured image to complete the calibration. In this way, the calibration figure that adapt to the luminescent type and size of the unit to be tested can be obtained.

Abstract: A method of spectral analyzing with a color camera is provided, and the method includes: calibrating a color camera to obtain a quantum efficiency database of the color camera; shooting a detection area with the color camera, the detection area including at least one object, to obtain the color content data of the at least one object; and comparing the color content data to the quantum efficiency database to analyze the at least one object.

Abstract: An electromagnetic interference (EMI) suppressor having a bandpass filtering function is provided. The EMI suppressor is disposed on a substrate, and includes a signal line, a ground line, an open-circuit line, a first line group, and a second line group. The signal line has an input terminal and an output terminal for feeding in and feeding out electromagnetic wave signals respectively. One terminal of the ground line is connected to the signal line and the other terminal is a ground terminal. One terminal of the open-circuit line is connected to the signal line and the other terminal is an open-circuit terminal. The first line group is formed by a first open-circuit line and a second open-circuit line, and is connected to the signal line. The second line group is formed by a third open-circuit line and a fourth open-circuit line, and is connected to the signal line.

Abstract: An electromagnetic interference (EMI) suppressor having a bandpass filtering function is provided. The EMI suppressor is disposed on a substrate, and includes a signal line, a ground line, an open-circuit line, a first line group, and a second line group. The signal line has an input terminal and an output terminal for feeding in and feeding out electromagnetic wave signals respectively. One terminal of the ground line is connected to the signal line and the other terminal is a ground terminal. One terminal of the open-circuit line is connected to the signal line and the other terminal is an open-circuit terminal. The first line group is formed by a first open-circuit line and a second open-circuit line, and is connected to the signal line. The second line group is formed by a third open-circuit line and a fourth open-circuit line, and is connected to the signal line.