Abstract: The present invention relates to the technical field of detection of the appearance of electronic components, and in particular to a method for detecting the appearance of six sides of a chip multi-layer ceramic capacitor based on artificial intelligence. In the method for detecting the appearance of six sides of a chip multi-layer ceramic capacitor based on artificial intelligence as provided by the present invention, a picture is automatically divided, by AI, into regions which are then classified, and extracted features are judged by conventional algorithms. It is more flexible to deal with various defects. Defect missing is avoided, and the false rate is reduced.