Abstract: An organic light-emitting diode (OLED) display panel and an OLED display device have a display region and a non-display region surrounding the display region. The non-display region includes a bonding region, a first fan-out line region, a bending region, and a second fan-out line region. A bonding test region is arranged between the bonding region and the first fan-out line region, a bonding test circuit is arranged in the bonding test region, and the bonding test circuit is used to detect whether a fan-out data line passing through the bonding region is abnormal.

Abstract: An organic light-emitting diode (OLED) display panel and an OLED display device have a display region and a non-display region surrounding the display region. The non-display region includes a bonding region, a first fan-out line region, a bending region, and a second fan-out line region. A bonding test region is arranged between the bonding region and the first fan-out line region, a bonding test circuit is arranged in the bonding test region, and the bonding test circuit is used to detect whether a fan-out data line passing through the bonding region is abnormal.

Abstract: The present disclosure provides a display device and a method of detecting a driving circuit. The display device of the present disclosure is provided with test switches on both first connection wires and second connection wires, so that wiring on both sides of the driving circuit can be tested, thereby preventing the driving circuit of the display device from missed detections and improving durability of the display device.

Abstract: The present disclosure provides a display device and a method of detecting a driving circuit. The display device of the present disclosure is provided with test switches on both first connection wires and second connection wires, so that wiring on both sides of the driving circuit can be tested, thereby preventing the driving circuit of the display device from missed detections and improving durability of the display device.

Abstract: An organic light-emitting diode display panel, a method of manufacturing the same, and a display device are provided. The organic light-emitting diode display panel includes a flexible substrate defined with a test circuit region thereon. The test circuit region is provided with a test circuit and defined with a circuit trace region. The circuit trace region includes a plurality of traces, a plurality of transistors, a control line, and at least one pin. Each one of the traces is connected to one of the transistors. The control line is electrically connected to a control end of each of the transistors to turn on or turn off the transistors to avoid the circuit from short-circuiting.

Abstract: An organic light-emitting diode display panel, a method of manufacturing the same, and a display device are provided. The organic light-emitting diode display panel includes a flexible substrate defined with a test circuit region thereon. The test circuit region is provided with a test circuit and defined with a circuit trace region. The circuit trace region includes a plurality of traces, a plurality of transistors, a control line, and at least one pin. Each one of the traces is connected to one of the transistors. The control line is electrically connected to a control end of each of the transistors to turn on or turn off the transistors to avoid the circuit from short-circuiting.

Abstract: A display panel test circuit that includes a plurality of metal-oxide-semiconductor field-effect transistors (MOSFETs); a first signal line electrically connected to gates of the MOSFETs; a second signal line electrically connected to sources of a part of the MOSFETs; and a third signal line electrically connected to sources of other part of the MOSFETs; wherein sources of any two adjacent MOSFETs of the plurality of MOSFETs are electrically connected to the second signal line and the third signal line, respectively. The display panel test circuit can detect a short circuit problem of a green data signal during a phase of lighting test, and thereby monitor and increase yields of AMOLED display panels.

Abstract: A display panel test circuit that includes a plurality of metal-oxide-semiconductor field-effect transistors (MOSFETs); a first signal line electrically connected to gates of the MOSFETs; a second signal line electrically connected to sources of a part of the MOSFETs; and a third signal line electrically connected to sources of other part of the MOSFETs; wherein sources of any two adjacent MOSFETs of the plurality of MOSFETs are electrically connected to the second signal line and the third signal line, respectively. The display panel test circuit can detect a short circuit problem of a green data signal during a phase of lighting test, and thereby monitor and increase yields of AMOLED display panels.