Abstract: A method of marking glass includes providing a glass material with a surface (201) and using a wire (210) to mark the surface. The wire is softer than the glass material and does not damage the surface of the glass material.

Abstract: An electron emitter (121, 221, 321, 421) includes an electron emitter structure (118) having a passivation layer (120, 220, 320, 420) formed thereon. The passivation layer (120, 220, 320, 420) is made from an oxide selected from a group consisting of the oxides of Ba, Ca, Sr, In, Sc, Ti, Ir, Co, Sr, Y, Zr, Ru, Pd, Sn, Lu, Hf, Re, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Th, and combinations thereof. In the preferred embodiment, the electron emitter structure (118) is made from molybdenum, and the passivation layer (120, 220, 320, 420) is made from an emission-enhancing oxide having a work function that is less than the work function of the molybdenum.

Abstract: A field emission device (100, 200) includes a cathode plate (102) having a plurality of electron emitters (532), an anode plate (104) disposed to receive electrons emitted by plurality of electron emitters (532), a frame (109) interposed between cathode plate (102) and anode plate (104) and defining a central opening (112), a mating member (110, 210, 310, 410, 510) coextensive with frame (109) and disposed within central opening (112), and a getter structure (114, 214, 314, 414, 514, 614) mated with mating member (110, 210, 310, 410, 510).

Abstract: A method for in situ cleaning of electron emitters (126, 226, 326, 526) in a field emission device (100, 200, 300, 400, 500) includes the steps of controllably providing hydrogen gas (142, 242, 342, 542) within the field emission device (100, 200, 300, 400, 500) at a time during the operational life of the field emission device (100, 200, 300, 400, 500) and, thereafter, emitting electrons from the electron emitters (126, 226, 326, 526), thereby forming hydrogen free radicals, which decontaminate and condition the emissive surfaces of the electron emitters (126, 226, 326, 526).

Abstract: A field emission display (200) includes a cathode plate (202); a substrate (102) opposing the cathode plate (202); a conductive matrix (104) disposed on the substrate (102) and having via walls (103) defining a plurality of phosphor vias (105); a phosphor (106, 108, 110) disposed within each of the phosphor vias (105); and a gas-adsorption material distributed within the conductive matrix (104). A method for fabricating the field emission display (200) includes the steps of silk-screening onto the substrate (102) a screenable suspension, which is made from a glass, a metal, a gas-adsorption material, and a photo-sensitive material, to form a film; photo-patterning the film to form a phosphor via (105); depositing a phosphor material into the phosphor via (105) to form an anode plate (100); and affixing the cathode plate (202) to the anode plate (100).

Abstract: A field emission device (100, 200) includes a cathode plate (110, 210), an anode plate (112, 212) spaced from the cathode plate (110, 210) to define an interspace region (114, 214) therebetween, a hole (144, 244) defined by the device package and in communication with the interspace region (114, 214), and a hydrogen-selective membrane (140, 240) disposed in registration with the hole (144, 244).

Abstract: An improved electrostatically-focused image intensifier tube, and a night vision device having such a tube, is substantially free of the spurious bright spots generally known as "PC Flash". The improved image intensifier tube includes an insulator which resists emission of electrons into the interior cavity of the tube, or a structure to capture such emitted electrons before they can fall into a microchannel plate of the tube and cause the PC Flash. A method of making such an image intensifier tube is also disclosed.

Abstract: A knife blade and knife blade assembly are disclosed for cutting food products into sticks or slices without causing surface cracking. The knife blade has a cutting portion defining a cutting edge and is mounted in the knife assembly such that a tension force is exerted on the knife blade in the plane of the cutting edge. The cutting edge of the knife blade is not sharp, but is generally flat and extends between parallel sides of the knife blade. The individual knife blades are formed of stainless steel and are electro-polished to remove any surface defects or sharp edges which may produce stress concentrations. This enables a significant tension force to be applied to the knife blade without diminishing its useful life. The electro-polishing process may also round off the corners of the juncture between the flat cutting edge and the parallel knife blade sides.