Abstract: A method for connecting a testing device, used for in-circuit testing of a unit under test, to a test fixture used to support the unit under test, without the use of discrete wiring. First electrical contacts on the testing device are arranged in a first layout and second electrical contacts on the test fixture are arranged in a second layout different from the first layout. A translator board is provided having third electrical contacts arranged in the first layout on a first surface, and fourth electrical contacts arranged in the second layout on a second surface with conductive traces forming an electrical connection therebetween. The translator board is placed on the testing device such that the third electrical contacts directly contact and are electrically with the first electrical contacts.

Abstract: A wireless assembly for communicating electrical signals between test equipment and a unit under test using contact probes having at a first end a spring-loaded head electrically connected to a test point on the unit under test, and having at a second end a fixed contact post. The wireless assembly is provided with a translator board having at least one conductive pad electrically connected to the test equipment. A guide plate having a first through hole communicating with a bore is provided on the translator board. A contact receptacle is provided in the bore and electrically contacts the conductive pad. The contact receptacle is adapted to at least partially receive the contact post, and is provided with at least one contact finger configured to swipe the contact post and maintain electrical connection therebetween. A spring provided in the bore urges the contact receptacle into electrical contact with the at least one conductive pad.

Abstract: A wireless assembly for communicating electrical signals between test equipment and a unit under test using contact probes having at a first end a head electrically connected to a test point on the unit under test and a contact at a second end. The wireless assembly includes a translator board electrically connected to the test equipment; a probe plate in a spaced relationship with the translator board, at least one probe socket having a compression ring and a contact, the probe socket being fitted through holes in the probe plate; and a contact receptacle provided on and electrically connected to the translator board. The contact receptacle provides wireless electrical interconnection between the probe and the translator board by exerting only a circumferential force on the probe, generally without exerting a static force on the translator board. The contact receptacle is configured to eliminate transient forces caused by flexure of the probe plate from being transmitted to the translator board.