Abstract: The present invention teaches an apparatus for testing the circuitry in an input/output (I/O) pad without probing the contact site on the I/O pad. A dominant driving circuit has an output coupled to a first contact site on a semiconductor chip. A subordinate driving circuit also has an output coupled to the first contact site on the semiconductor chip. A test control circuit sets a drive fight up between the dominant and subordinate driving circuits, the test control circuit selecting a stronger drive strength for the dominant driving circuit than for the subordinate driving circuit. The drive fight produces a test value at the first contact site. The test value from the first contact site is transferred to a second contact site on the semiconductor chip to be probed by an external prober.

Abstract: The present invention teaches an apparatus for testing the circuitry in an input/output (I/O) pad without probing the contact site on the I/O pad. A dominant driving circuit has an output coupled to a first contact site on a semiconductor chip. A subordinate driving circuit also has an output coupled to the first contact site on the semiconductor chip. A test control circuit sets a drive fight up between the dominant and subordinate driving circuits, the test control circuit selecting a stronger drive strength for the dominant driving circuit than for the subordinate driving circuit. The drive fight produces a test value at the first contact site. The test value from the first contact site is transferred to a second contact site on the semiconductor chip to be probed by an external prober.

Abstract: A coil assembly for disk drive components is presented which includes a coil winding free of lubricants that cause stiction problems during the operation of the disk drive assembly. An actuator coil and spindle motor winding are disclosed which include a conductor, an insulating layer over the conductor, a bond coat overlying the insulating layer, and a lubricant coating on the insulating layer. The lubricant coating is a hydrocarbon based oil having a molecular weight within ranges that will not volatilize and condense on the surface of the disks in the drive.

Abstract: IDDQ of an integrated circuit is rapidly measured with system test equipment providing sampled pass/fail outputs. A switch couples the power supply to the integrated circuit and another switch returns a sense signal input to the integrated circuit such that the power may be interrupted to measure the decay of the voltage across the integrated circuit. A monitor signal output is coupled to the integrated circuit to enable monitoring of the voltage decay. At least one processor, which periodically samples the voltage signal, compares the magnitude of the voltage signal at the time of each said periodic sample to a predetermined reference signal, indicates a voltage signal less than the reference signal and calculates the IDDQ based upon the number of periodic samples from the time power is removed from the integrated circuit and the voltage of the reference signal.

Abstract: In order to measure IDDQ in a large integrated circuit, multiple IDDQ monitors sampling the current drawn by selected portions of the circuit are placed on the integrated circuit chip. The output of each IDDQ monitor is combined and supplied to one output port when any of the IDDQ monitors detect current in excess of a predetermined threshold. The output of each IDDQ monitor is also stored in a memory for subsequent readout at a second output port for detection of particular portions drawing the excessive current.