Abstract: A test apparatus to determine the trip setting of a bimetallic element of a thermal tripping mechanism of the circuit breaker. The apparatus comprising a conveyance configured to receive and move the circuit breaker. A radio frequency induction heater positioned below the conveyance and including an induction coil operatively connected to the induction heater, wherein the induction coil is located below the bimetallic element of the thermal tripping mechanism of the circuit breaker. The radio frequency induction heater may operate with a frequency of 250 KHz to 750 KHz. The test apparatus can also include a mechanical ejection apparatus configured to remove the circuit breaker from the conveyance if the circuit breaker did not meet predetermined criteria and an electrical test apparatus configured to test the circuit breaker if the circuit breaker met predetermined criteria.