Abstract: An apparatus for measuring the visual characteristics of a surface of a workpiece includes two separate light sources. The first source provides one or more focused beams of light which strike the workpiece at a first angle and are reflected therefrom. The second source provides one or more unfocused beams of light which strike the workpiece at a second angle, different from the first angle, and are reflected therefrom. All of the reflected beams converge onto a single photo detector. The beams are time multiplexed so that the photo detector only reads one beam at a time. The output of the photo detector is processed to provide surface quality measurements of the workpiece such as gloss, distinctness of image and orange peel.

Abstract: An apparatus for measuring the visual characteristics of a surface of a workpiece includes two separate light sources. The first source provides one or more focused beams of light which strike the workpiece at a first angle and are reflected therefrom. The second source provides one or more unfocused beams of light which strike the workpiece at a second angle, different from the first angle, and are reflected therefrom. All of the reflected beams converge onto a single photo detector. The beams are time multiplexed so that the photo detector only reads one beam at a time. The output of the photo detector is processed to provide surface quality measurements of the workpiece such as gloss, distinctness of image and orange peel.

Abstract: An apparatus for scanning the visual characteristics of a surface includes an illumination system which scans a beam of light across the surface for reflection therefrom. The reflected beam is split into two parts. A first part goes to a control sensor which generates a control signal in response to the spatial distribution of the intensity of the reflected light. A second portion of the reflected light goes to a measuring sensor. A field mask is disposed in the beam of reflected light and operates to restrict the cross-sectional area of the beam which impinges upon the measuring sensor. Positioning of the field mask is controlled by a driver responsive to the control signal produced by the control sensor. In this manner, the field mask may be positioned so as to select only specularly reflected light for measurement.