Abstract: A data processing system stores encrypted data. Object identifiers are assigned to storage objects, and data encryption keys are assigned to the storage objects. When performing an operation upon a storage object, data encryption key failure may occur due to a corrupt or incorrect key. In this case, a copy of the data encryption key is fetched from a key server. It is possible for the association of the object identifiers with the data encryption keys to become lost or confused, so that the key server may fail to provide the correct key for a specified object identifier. Therefore, an absolute key identifier that is unique across the key server namespace also is stored in association with the object identifier in the storage system and in the key store of the key server, and the absolute key identifier is used as a failsafe for recovery of encrypted data.

Abstract: A data processing system stores encrypted data. Object identifiers are assigned to storage objects, and data encryption keys are assigned to the storage objects. When performing an operation upon a storage object, data encryption key failure may occur due to a corrupt or incorrect key. In this case, a copy of the data encryption key is fetched from a key server. It is possible for the association of the object identifiers with the data encryption keys to become lost or confused, so that the key server may fail to provide the correct key for a specified object identifier. Therefore, an absolute key identifier that is unique across the key server namespace also is stored in association with the object identifier in the storage system and in the key store of the key server, and the absolute key identifier is used as a failsafe for recovery of encrypted data.

Abstract: Power supply slew time testing is performed on units that require a power supply for operation. A power supply voltage is applied to a unit under test. The power supply voltage has a test slew time that is selected to evaluate operation of the unit under test in a system. A response of the unit under test to the power supply having the test slew time is observed, and the condition of the unit under test is determined based on the response to the power supply having the test slew time. The test may involve application of the power supply voltage having a maximum test slew time and application of the power supply voltage having a minimum test slew time. The test slew times are selected based on the expected range of power supply slew times when the unit is installed in a system.