Abstract: A control system emulates an X-ray spectrum generation and analyzing system on a computer by emulating the experimental apparatus, emulating the experimental geometry between elements of the experimental apparatus and emulating a material sample within the experimental apparatus including the emulated material sample's physical properties. The control system allows an operator generate theoretical spectra of material samples based on the emulated experimental apparatus and the physical characteristics of the emulated material sample. The control system also allows the operator to compare the generated theoretical spectrum to a real spectrum acquired from the experimental system and sample which have been emulated. Thus, the operator can easily determine the sufficiency of the emulation of the experimental set-up. The control system further allows the operator to analyze the generated theoretical spectra.