Abstract: A test probe includes an electrically insulating handle, an electrically conducting blade extending from the handle, an electrically insulating shroud including a first portion and a second portion that are at least partially disposed around the electrically conducting blade. A housing is attached to the handle such that the first portion of the shroud is disposed within the housing, and the second portion of the shroud extends from an aperture formed in the housing. A spring disposed between the handle and the shroud biases the shroud toward the aperture formed in the housing. The shroud protects the electrically conducting blade from unintentional contact with a conductor during testing. When the test probe is correctly positioned on a device being tested, the shroud retracts into the housing exposing the electrically conducting blade. When the test probe is moved away from the device, the shroud returns to its original position.

Abstract: Exemplary embodiments provides a camera, having a first camera sub-assembly, a hub coupled to the first camera sub-assembly, a second camera sub-assembly coupled to the hub and rotatable relative thereto and a third camera sub-assembly coupled to the hub and rotatable relative thereto. The third camera sub-assembly can be in electrical communication with the first camera sub-assembly and/or the second camera sub-assembly via the hub. The hub can include a slot to guide electrical cable(s). Net torque acting on the camera can be zero such that one of the first rotational coupling or the second rotational coupling when rotated to a new position via an applied torque remains in the new position when the applied torque is released.

Abstract: A test probe includes an electrically insulating handle, an electrically conducting blade extending from the handle, an electrically insulating shroud including a first portion and a second portion that are at least partially disposed around the electrically conducting blade. A housing is attached to the handle such that the first portion of the shroud is disposed within the housing, and the second portion of the shroud extends from an aperture formed in the housing. A spring disposed between the handle and the shroud biases the shroud toward the aperture formed in the housing. The shroud protects the electrically conducting blade from unintentional contact with a conductor during testing. When the test probe is correctly positioned on a device being tested, the shroud retracts into the housing exposing the electrically conducting blade. When the test probe is moved away from the device, the shroud returns to its original position.

Abstract: Exemplary embodiments provides a camera, having a first camera sub-assembly, a hub coupled to the first camera sub-assembly, a second camera sub-assembly coupled to the hub and rotatable relative thereto and a third camera sub-assembly coupled to the hub and rotatable relative thereto. The third camera sub-assembly can be in electrical communication with the first camera sub-assembly and/or the second camera sub-assembly via the hub. The hub can include a slot to guide electrical cable(s). Net torque acting on the camera can be zero such that one of the first rotational coupling or the second rotational coupling when rotated to a new position via an applied torque remains in the new position when the applied torque is released.

Abstract: Imaging tools can be fixedly or removably attached to various surfaces of test and measurement tools. An imaging tool comprising a sensor array capable of receiving electromagnetic radiation from a target scene can be configured to engage a surface of the test and measurement tool such that the imaging tool is supported by the test and measurement tool. When the imaging tool is engaged with the test and measurement tool, the sensor array can be movable relative to the imaging tool so that a target scene viewed by the sensor array of the imaging tool is adjustable without requiring movement of the test and measurement tool.