Abstract: An image sensing chip includes an active pixel sensor array including a plurality of pixels arranged in rows and columns. A built in self test circuit is coupled to the active pixel sensor array. The built in self test circuit includes an output port adapted to be coupled to external circuitry and the built in self test circuit is operable to test the active pixel sensor array and provide the results of the test on the output port.

Abstract: A delay circuit is provided that delays the sampling signal by a selected amount in order to ensure that sampling does not occur concurrently with the occurrence of a noisy event. The noisy events on the IC tend to be periodic and occur at regular intervals. The invention allows the delay in the sampling signal to be adjusted such that sampling does not occur at the same time as the reoccurring noisy event. This ensures that the sample signals will not have noise in them resulting from the occurrence of the noisy event. In addition, the delay circuit is programmable to allow the amount of delay to be set on the fly.

Abstract: An image sensing chip includes an active pixel sensor array including a plurality of pixels arranged in rows and columns. A built in self test circuit is coupled to the active pixel sensor array. The built in self test circuit includes an output port adapted to be coupled to external circuitry and the built in self test circuit is operable to test the active pixel sensor array and provide the results of the test on the output port.

Abstract: An active pixel sensor (APS) image sensor comprises an array of pixel circuits corresponding to rows and columns of pixels, a plurality of amplifiers that buffer signals output by the array of pixel circuits, and a plurality of sample and hold circuits that read the buffered signals. A routing mechanism is positioned between the array of pixel circuits and the plurality of amplifiers.

Abstract: A delay circuit is provided that delays the sampling signal by a selected amount in order to ensure that sampling does not occur concurrently with the occurrence of a noisy event. The noisy events on the IC tend to be periodic and occur at regular intervals. The invention allows the delay in the sampling signal to be adjusted such that sampling does not occur at the same time as the reoccurring noisy event. This ensures that the sample signals will not have noise in them resulting from the occurrence of the noisy event. In addition, the delay circuit is programmable to allow the amount of delay to be set on the fly.

Abstract: A system and method utilizing an imaging device able to distribute readout paths for pixel signals in a captured image. The device includes a pixel array organized into a plurality of sets of pixels, each pixel in each set of pixels operable to store a signal corresponding to a respective light level. The device further includes a readout circuit having a plurality of readout paths coupled to the pixel array, each readout path operable to read the signal stored in a corresponding pixel in a set of pixels, each readout path corresponding to one pixel during a readout phase for each set of pixels. The device further includes a readout path selection circuit coupled to the readout circuit and operable set a pattern for matching one readout path to one pixel for each set of pixels for each readout phase, the pattern differing from set to set.