Patents by Inventor Charles H. Skinner

Charles H. Skinner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7038460
    Abstract: An apparatus for detecting dust in a variety of environments which can include radioactive and other hostile environments both in a vacuum and in a pressurized system. The apparatus consists of a grid coupled to a selected bias voltage. The signal generated when dust impacts and shorts out the grid is electrically filtered, and then analyzed by a signal analyzer which is then sent to a counter. For fine grids a correlation can be developed to relate the number of counts observed to the amount of dust which impacts the grid.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: May 2, 2006
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Charles H. Skinner
  • Patent number: 5177774
    Abstract: A reflection soft X-ray microscope is provided by generating soft X-ray beams, condensing the X-ray beams to strike a surface of an object at a predetermined angle, and focusing the X-ray beams reflected from the surface onto a detector, for recording an image of the surface or near surface features of the object under observation.
    Type: Grant
    Filed: August 23, 1991
    Date of Patent: January 5, 1993
    Assignee: Trustees of Princeton University
    Inventors: Szymon Suckewer, Charles H. Skinner, Roy Rosser
  • Patent number: 4979203
    Abstract: A microscope consisting of an x-ray contact microscope and an optical microscope. The optical, phase contrast, microscope is used to align a target with respect to a source of soft x-rays. The source of soft x-rays preferably comprises an x-ray laser but could comprise a synchrotron or other pulse source of x-rays. Transparent resist material is used to support the target. The optical microscope is located on the opposite side of the transparent resist material from the target and is employed to align the target with respect to the anticipated soft x-ray laser beam. After alignment with the use of the optical microscope, the target is exposed to the soft x-ray laser beam. The x-ray sensitive transparent resist material whose chemical bonds are altered by the x-ray beam passing through the target materGOVERNMENT LICENSE RIGHTSThis invention was made with government support under Contract No. De-FG02-86ER13609 awarded by the Department of Energy. The Government has certain rights in this invention.
    Type: Grant
    Filed: June 19, 1989
    Date of Patent: December 18, 1990
    Assignee: Princeton X-Ray Laser
    Inventors: Szymon Suckewer, Darrell S. DiCicco, Joseph G. Hirschberg, Lewis D. Meixler, Robert Sathre, Charles H. Skinner
  • Patent number: 4771430
    Abstract: An enhancement of approximately 100 of stimulated emission over spontaneous emission of the CVI 182 Angstrom line was obtained in a recombining magnetically confined plasma column. The plasma was formed by focusing a CO.sub.2 laser beam on a carbon disc. A magnetic solenoid produced a strong magnetic field which confined the plasma to the shape of a column. A single thin carbon blade extended parallel to the plasma column and served to make the column axially more uniform and also acted as a heat sink. Axial and transverse measurements of the soft X-ray lasing action were made from locations off-set from the central axis of the plasma column. Multiple carbon blades located at equal intervals around the plasma column were also found to produce acceptable results. According to another embodiment 10 a thin coating of aluminum or magnesium was placed on the carbon disc and blade. The Z of the coating should preferably be at least 5 greater than the Z of the target.
    Type: Grant
    Filed: July 24, 1985
    Date of Patent: September 13, 1988
    Assignee: Princeton University
    Inventors: Szymon Suckewer, Charles H. Skinner, David R. Voorhees