Abstract: A electronics system and method are provided which allow engineering changes to be made to a substrate without requiring the addition of fly wires and without requiring relatively large areas of pads for attaching these wires. Each device site is surrounded by a series of engineering change ring patterns. A series of engineering change patterns allow change interconnections between device sites to be made. Fan-in metallizations extend inwardly to the device sites from these change patterns, with a series of vias making surface connections adjacent to the ring patterns. Fan-out metallizations extend from the device site pads to the ring patterns, with a series of vias making surface connections adjacent to the ring patterns. Engineering changes are made by directly writing surface metal deposits to make the appropriate connections between the vias and the ring pattern. The original chip pad connections and the new ring pattern connections can be appropriately isolated by laser deletions, if necessary.

Abstract: Engineering changes in the wiring between semiconductor device chips supported on the same substrate are made using minimum substrate real estate and without the use of engineering change pads or discrete wires by the use of easily modified chip interposers. The interposers are inserted between respective chips and the substrate. The interposers comprise conductive vias and multiple internal wiring planes which are selectively connected to the vias.

Abstract: A multilayered interposer powering board is disclosed for the distribution of required voltage levels to integrated circuit chip modules under conditions of high current demand and heat induced expansions. The interposer board is introduced between the module and its module mounting board. Flexible connector fingers are intermetallically or ohmically connected between a given level of the interposer board and a given power level of the module.

Abstract: A multiple chip module is provided with an engineering change (EC)/repair facility by means of delete lines located on both major surfaces of the module. In one embodiment, defective pin vias through the module are repaired by use of the delete lines on both major surfaces.

Abstract: The wiring nets on a module are divided into two groups of planes, i.e., an upper group in which wiring is placed along "north-south" and "east-west" directions and a lower group in which wiring is placed along diagonal directions. All vias for connecting to the wiring pass through the upper group of planes but only half of the vias pass through the lower group of planes. Thus the spacing between the vias of the lower group of planes is greater than the spacing between the upper vias, allowing more lines per wiring channel in the lower group of planes.