Patents by Inventor Charles M. Hartmann

Charles M. Hartmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe tip and probe assembly
    Patent number: 10241133
    Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.
    Type: Grant
    Filed: November 7, 2017
    Date of Patent: March 26, 2019
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, William A. Hagerup, Ira G. Pollock, Christina D. Enns, James E. Spinar, Kathleen F. M. Ullom, Charles M. Hartmann, Daniel J. Ayres
  • High impedance compliant probe tip
    Patent number: 10119992
    Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.
    Type: Grant
    Filed: April 1, 2015
    Date of Patent: November 6, 2018
    Assignee: Tektronix, Inc.
    Inventors: William A. Hagerup, Julie A. Campbell, Ira G. Pollock, James E. Spinar, Kathleen F. M. Ullom, Charles M. Hartmann, Daniel J. Ayres, Christina D. Enns
  • PROBE TIP AND PROBE ASSEMBLY
    Publication number: 20180059139
    Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.
    Type: Application
    Filed: November 7, 2017
    Publication date: March 1, 2018
    Applicant: Tektronix, Inc.
    Inventors: Julie A. Campbell, William A. Hagerup, Ira G. Pollock, Christina D. Enns, James E. Spinar, Kathleen F.M. Ullom, Charles M. Hartmann, Daniel J. Ayres
  • HIGH IMPEDANCE COMPLIANT PROBE TIP
    Publication number: 20160291054
    Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.
    Type: Application
    Filed: April 1, 2015
    Publication date: October 6, 2016
    Inventors: William A. Hagerup, Julie A. Campbell, Ira G. Pollock, James E. Spinar, Kathleen F.M. Ullom, Charles M. Hartmann, Daniel J. Ayres, Christina D. Enns