Abstract: A control circuit for scanning a pressure or force responsive sensor array is disclosed. Pressure or force sensors formed of an array of pressure or force responsive sensor elements can be used to acquire pressure or force measurements in response to an applied load. The control circuit can sample signals from the sensor elements to detect the pressure or force at one or more sensor elements of the sensor array. The circuit herein may provide for relatively faster scan rates. A user may define a subset or subsets of sensor elements of the sensor array to be scanned. Various methods and related circuitry for adjusting for sensor characteristics are also disclosed.

Abstract: A sensor for measuring a parameter applied to a surface is provided. The sensor includes at least one substrate layer, a plurality of individual sensor elements operatively arranged with respect to the substrate layer, and a conductive trace disposed on the substrate layer. The conductive trace is electrically coupled to an individual sensor element and wraps around at least a portion of the sensor element in a spiral-like manner. Further, by employing slits or cut-outs of material between sensor elements, a sensor element may move independent of an adjacent sensor element, thereby allowing the sensor to conform to an irregularly shaped surface or otherwise when subject to relatively large deflections. The sensor may be employed to detect force distribution of a seating surface, such as a seat cushion of a wheelchair.

Abstract: A system and method for equilibrating and calibrating a pressure or force sensor is provided. The system includes a flexible bag arranged to receive the sensor, and a vacuum source, connectable with the flexible bag, adapted to reduce the pressure within the flexible bag. By reducing the pressure within the flexible bag, such that the pressure inside of the bag is less than the pressure outside of the bag, the resultant uniform pressure acting on the sensor is used to calibrate and equilibrate the sensor. The system may include a porous material in the flexible bag to facilitate the evacuation of air from within the flexible bag as the pressure is reduced. The system may also include an opening, such that when the sensor is placed in the bag, a portion of the sensor extends outside of the bag to communicate with a controller. The opening may be provided either on the flexible bag, or on a clamp attached to the flexible bag.

Abstract: A system and method for equilibrating and calibrating a pressure or force sensor is provided. The system includes a flexible bag arranged to receive the sensor, and a vacuum source, connectable with the flexible bag, adapted to reduce the pressure within the flexible bag. By reducing the pressure within the flexible bag, such that the pressure inside of the bag is less than the pressure outside of the bag, the resultant uniform pressure acting on the sensor is used to calibrate and equilibrate the sensor. The system may include a porous material in the flexible bag to facilitate the evacuation of air from within the flexible bag as the pressure is reduced. The system may also include an opening, such that when the sensor is placed in the bag, a portion of the sensor extends outside of the bag to communicate with a controller. The opening may be provided either on the flexible bag, or on a clamp attached to the flexible bag.

Abstract: A sensor for measuring a parameter applied to a surface is provided. The sensor includes at least one substrate layer, a plurality of individual sensor elements operatively arranged with respect to the substrate layer, and a conductive trace disposed on the substrate layer. The conductive trace is electrically coupled to an individual sensor element and wraps around at least a portion of the sensor element in a spiral-like manner. Further, by employing slits or cut-outs of material between sensor elements, a sensor element may move independent of an adjacent sensor element, thereby allowing the sensor to conform to an irregularly shaped surface or otherwise when subject to relatively large deflections. The sensor may be employed to detect force distribution of a seating surface, such as a seat cushion of a wheelchair.

Abstract: A sensor for measuring a parameter applied to a surface is provided. The sensor includes at least one substrate layer, a plurality of individual sensor elements operatively arranged with respect to the substrate layer, and a conductive trace disposed on the substrate layer. The conductive trace is electrically coupled to an individual sensor element and wraps around at least a portion of the sensor element in a spiral-like manner. Further, by employing slits or cut-outs of material between sensor elements, a sensor element may move independent of an adjacent sensor element, thereby allowing the sensor to conform to an irregularly shaped surface or otherwise when subject to relatively large deflections. The sensor may be employed to detect force distribution of a seating surface, such as a seat cushion of a wheelchair.

Abstract: A sensor for measuring a parameter applied to a surface is provided. The sensor includes at least one substrate layer, a plurality of individual sensor elements operatively arranged with respect to the substrate layer, and a conductive trace disposed on the substrate layer. The conductive trace is electrically coupled to an individual sensor element and wraps around at least a portion of the sensor element in a spiral-like manner. Further, by employing slits or cut-outs of material between sensor elements, a sensor element may move independent of an adjacent sensor element, thereby allowing the sensor to conform to an irregularly shaped surface or otherwise when subject to relatively large deflections. The sensor may be employed to detect force distribution of a seating surface, such as a seat cushion of a wheelchair.

Abstract: This invention relates to apparatus for detecting the contact or nip width between two contacting surfaces. The apparatus includes first and second insulating substrates each of which has a pattern of conductive material formed on a facing inner surface thereof, which substrates are adapted to be fitted between the contacting surfaces. For a first embodiment, the pattern of conductive material on one substrate includes a pair of conductive terminals spaced by a distance greater than the contact width to be measured and the conductive pattern on the other substrate includes a conductor which extends over at least a distance greater than the maximum width W to be measured.