Patents by Inventor Charles R. Younger

Charles R. Younger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Technique for doping mercury cadmium telluride MOCVD grown crystalline materials using free radical transport of elemental indium and apparatus therefor
    Patent number: 5306660
    Abstract: Method and apparatus for vapor phase free methyl radical transport of indium dopant species for precise predetermined reproducible doping concentrations to control electrical properties for MOCVD grown materials.
    Type: Grant
    Filed: February 19, 1991
    Date of Patent: April 26, 1994
    Assignee: Rockwell International Corporation
    Inventors: Charles R. Younger, Shawn L. Johnston, Stuart J. C. Irvine, Edward R. Gertner, Kenneth L. Hess
  • Technique for doping MOCVD grown crystalline materials using free radical transport of the dopant species
    Patent number: 5202283
    Abstract: Method for organic free radical, including aliphatic radical, transport of dopant species for precise, predetermined, and reproducible doping concentrations to control electrical properties for chemical vapor deposition grown materials.
    Type: Grant
    Filed: February 19, 1991
    Date of Patent: April 13, 1993
    Assignee: Rockwell International Corporation
    Inventors: Charles R. Younger, Kenneth L. Hess, Stuart J. C. Irvine, Edward R. Gertner, Shawn L. Johnston
  • Apparatus and method for contactless measurement of coating thickness
    Patent number: 5021655
    Abstract: An apparatus for measuring the thickness of a coating on a work piece includes a table for receiving and positioning the coated work piece and beta-ray backscatter measuring instrument for determining the thickness of the coating on the work piece. An air gauge measures accurately the position of the surface of the work piece and causes the measuring detector instrument to be positioned a predetermined distance above the surface of the work piece. The air gauge includes an orifice having a known positional relationship with respect to the beta-ray measuring instrument. The air gauge positions the orifice a known distance above a particular location on the surface of the work piece. The apparatus then positions the beta-ray measuring instrument over that particular location on the work piece, at the predetermined distance above the surface.
    Type: Grant
    Filed: May 2, 1990
    Date of Patent: June 4, 1991
    Assignee: Rockwell International Corporation
    Inventors: Thomas P. Weismuller, Charles R. Younger