Abstract: In a mass spectrometer or gas chromatograph/mass spectrometer system, one or more different conditioning gases are added to condition or modify one or more surfaces or regions of the ion source. The conditioning gas(es) may be added directly into the ion source. The conditioning gas may be added off-line, when the mass spectrometer is not analyzing a sample.

Abstract: In a mass spectrometer or gas chromatograph/mass spectrometer system, one or more different conditioning gases are added to condition or modify one or more surfaces or regions of the ion source. The conditioning gas(es) may be added directly into the ion source. The conditioning gas may be added off-line, when the mass spectrometer is not analyzing a sample.

Abstract: A mass calibration apparatus for a mass spectrometer includes a capillary, an analyte ion source coupled to the capillary at a first point, a reference mass ion source coupled to the capillary at a second point, downstream from the first point and a mass analyzer coupled to the capillary at a third point downstream from the first and second points. The reference mass ion source may be coupled to the capillary via a tee junction. The reference mass ion source includes a chamber, an ionization device situated within the chamber and one or more reference mass sources that are situated internally within the chamber or are situated external to and coupled to the chamber.

Abstract: For generation and delivery of ions from an ionization chamber through an ion entrance orifice to a mass analyzer operating at high vacuum, high pass ion filtration is effected within the ionization chamber by application of electrical potentials to an electrode associated with the ion entrance orifice and to an electrode between the ionization region and the ion entrance orifice to create a retarding electric field upstream from the ion entrance orifice. The retarding electric field hinders the movement to the ion entrance orifice of ions having drift velocities below a lower limit, and as the retarding voltage gradient is made steeper, the lower limit increases.

Abstract: The invention provides an apparatus for focusing ions exiting a multipole mass filter. In general terms, the ion focusing apparatus comprises: a housing having an ion entrance and an ion exit, and, contained within the housing: a) a multipole ion guide having an open ion entrance end, and b) a neutral gas. The ion focusing apparatus is configured so that an ion beam enters the housing via the ion entrance and is collisionally focused by the multipole ion guide and neutral gas prior to exiting the housing. The apparatus is readily employed to collisionally focus an ion beam exiting a quadrupole mass filter. Also provided is a mass spectrometry system containing the ion focusing apparatus, and methods employing the same.

Abstract: For generation and delivery of ions from an ionization chamber through an ion entrance orifice to a mass analyzer operating at high vacuum, high pass ion filtration is effected within the ionization chamber by application of electrical potentials to an electrode associated with the ion entrance orifice and to an electrode between the ionization region and the ion entrance orifice to create a retarding electric field upstream from the ion entrance orifice. The retarding electric field hinders the movement to the ion entrance orifice of ions having drift velocities below a lower limit, and as the retarding voltage gradient is made steeper, the lower limit increases.

Abstract: An apparatus and method for calibrating a mass spectrometer by internally introducing calibration masses at a post-source stage of the mass spectrometer is provided. A source of lock mass ions adjacent the ion optics creates lock mass ions within the ion optics. Lock mass ions mix with the analyte ions in the ion optics prior to mass analysis. The source of lock mass ions may include various means for ionizing lock mass molecules including but not limited to photoionization, field desorption-ionization, electron ionization, and thermal ionization means. An apparatus and method of mass calibrating a tandem mass spectrometer is also provided. The mass calibration apparatus includes a collision cell for fragmenting analyte ions and a source of lock mass ions adjacent said collision cell for creating lock mass ions in the collision cell.

Abstract: An apparatus and method for calibrating a mass spectrometer by internally introducing calibration masses at a post-source stage of the mass spectrometer is provided. A source of lock mass ions adjacent the ion optics creates lock mass ions within the ion optics. Lock mass ions mix with the analyte ions in the ion optics prior to mass analysis. The source of lock mass ions may include various means for ionizing lock mass molecules including but not limited to photoionization, field desorption-ionization, electron ionization, and thermal ionization means. An apparatus and method of mass calibrating a tandem mass spectrometer is also provided. The mass calibration apparatus includes a collision cell for fragmenting analyte ions and a source of lock mass ions adjacent said collision cell for creating lock mass ions in the collision cell.

Abstract: For delivery of ions from a higher pressure ion source to a mass analyzer operating at high vacuum, high pass ion filtration is effected within a dielectric capillary interface between the higher pressure ionization chamber and the lower pressure environment of a mass analyzer, by application of electrical potentials to end electrodes and to at least one electrode associated with the dielectric capillary between the ends, to create an end-to-end electric field generally opposing gas flow-assisted movement of ions from the upstream end to the downstream end, and to create a steeper voltage gradient along an upstream portion than along a downstream portion of the capillary. The voltage gradient along the steeper upstream portion of the capillary is sufficiently steep to cause ions having drift velocities below a lower limit to stall within the capillary. The respective potentials may be adjusted to increase the steepness of the upstream voltage gradient to increase the drift velocity lower limit.

Abstract: An apparatus and method for calibrating a mass spectrometer by internally introducing calibration masses at a post-source stage of the mass spectrometer is provided. A source of lock mass ions adjacent the ion optics creates lock mass ions within the ion optics. Lock mass ions mix with the analyte ions in the ion optics prior to mass analysis. The source of lock mass ions may include various means for ionizing lock mass molecules including but not limited to photoionization, field desorption-ionization, electron ionization, and thermal ionization means. An apparatus and method of mass calibrating a tandem mass spectrometer is also provided. The mass calibration apparatus includes a collision cell for fragmenting analyte ions and a source of lock mass ions adjacent said collision cell for creating lock mass ions in the collision cell.

Abstract: An apparatus and method for calibrating a mass spectrometer by internally introducing calibration masses at a post-source stage of the mass spectrometer is provided. A source of lock mass ions adjacent the ion optics creates lock mass ions within the ion optics. Lock mass ions mix with the analyte ions in the ion optics prior to mass analysis. The source of lock mass ions may include various means for ionizing lock mass molecules including but not limited to photoionization, field desorption-ionization, electron ionization, and thermal ionization means. An apparatus and method of mass calibrating a tandem mass spectrometer is also provided. The mass calibration apparatus includes a collision cell for fragmenting analyte ions and a source of lock mass ions adjacent said collision cell for creating lock mass ions in the collision cell.

Abstract: Apparatus and methods are disclosed for manipulating charged particles. The charged particles are directed from a source thereof into a zone. A first electrical potential is generated in the zone. Simultaneously, a second electrical potential is generated outside the zone. The second electrical potential penetrates into the zone and combines with the first electrical potential to form an oscillating electric potential field having predetermined characteristics sufficient to manipulate the charged particles. The manipulating of the charged particles includes, e.g., transporting, collisional cooling, collisional induced dissociating and collisional focusing. In one embodiment an apparatus comprises a hollow first element and a hollow second element. The second element is disposed within the first element. The second element has at least two openings in a wall thereof. The openings are elongated and radially disposed with respect to the axis of the second element.

Abstract: The present invention relates to a method for selectively delivering ions to a mass analyzer operating in a vacuum region. The method involves providing a dielectric conduit having an axial bore originating in an inlet opening that communicates with an ion source and terminating in an exit opening disposed within the vacuum region. A gas stream comprising an ion having a polarity and traveling at a drift velocity is flowed through the bore from the inlet opening toward the exit opening. A motion component is altered in a manner that does not substantially depend on the polarity of the ion to effect a change in the drift velocity of the ion. The invention also provides an apparatus to carry out the method.

Abstract: For generation and delivery of ions from an ionization chamber through an ion entrance orifice to a mass analyzer operating at high vacuum, high pass ion filtration is effected within the ionization chamber by application of electrical potentials to an electrode associated with the ion entrance orifice and to an electrode between the ionization region and the ion entrance orifice to create a retarding electric field upstream from the ion entrance orifice. The retarding electric field hinders the movement to the ion entrance orifice of ions having drift velocities below a lower limit, and as the retarding voltage gradient is made steeper, the lower limit increases.

Abstract: For delivery of ions from a higher pressure ion source to a mass analyzer operating at high vacuum, high pass ion filtration is effected within a dielectric capillary interface between the higher pressure ionization chamber and the lower pressure environment of a mass analyzer, by application of electrical potentials to end electrodes and to at least one electrode associated with the dielectric capillary between the ends, to create an end-to-end electric field generally opposing gas flow-assisted movement of ions from the upstream end to the downstream end, and to create a steeper voltage gradient along an upstream portion than along a downstream portion of the capillary. The voltage gradient along the steeper upstream portion of the capillary is sufficiently steep to cause ions having drift velocities below a lower limit to stall within the capillary. The respective potentials may be adjusted to increase the steepness of the upstream voltage gradient to increase the drift velocity lower limit.

Abstract: For delivery of ions from a higher pressure ion source to a mass analyzer operating at high vacuum, high pass ion filtration is effected within a dielectric capillary interface between the higher pressure ionization chamber and the lower pressure environment of a mass analyzer, by application of electrical potentials to end electrodes and to at least one electrode associated with the dielectric capillary between the ends, to create an end-to-end electric field generally opposing gas flow-assisted movement of ions from the upstream end to the downstream end, and to create a steeper voltage gradient along an upstream portion than along a downstream portion of the capillary. The voltage gradient along the steeper upstream portion of the capillary is sufficiently steep to cause ions having drift velocities below a lower limit to stall within the capillary. The respective potentials may be adjusted to increase the steepness of the upstream voltage gradient to increase the drift velocity lower limit.

Abstract: A ring pole ion guide apparatus and method provide the focusing and confinement advantages of conventional multipoles and the axial field of a conventional DC ring guide all in one device. The ring pole apparatus comprises a ring stack portion and a multipole portion, wherein the ring stack portion essentially overlaps the multipole portion inside and outside along a central axis. The ring pole apparatus can be used in a mass spectrometer system to guide ions from the ion source to the mass spectrometer or between mass spectrometer stages, or to dissociate ions into daughter ions in an ion dissociation system. A single ring pole ion guide can span a plurality of pressure transition stages with several of the rings acting as pressure partitions.

Abstract: Apparatus and methods are disclosed for manipulating charged particles. The charged particles are directed from a source thereof into a zone. A first electrical potential is generated in the zone. Simultaneously, a second electrical potential is generated outside the zone. The second electrical potential penetrates into the zone and combines with the first electrical potential to form an oscillating electric potential field having predetermined characteristics sufficient to manipulate the charged particles. The manipulating of the charged particles includes, e.g., transporting, collisional cooling, collisional induced dissociating and collisional focusing. In one embodiment an apparatus comprises a hollow first element and a hollow second element. The second element is disposed within the first element. The second element has at least two openings in a wall thereof. The openings are elongated and radially disposed with respect to the axis of the second element.

Abstract: A mass spectrometer having an ionization source containing a chemical ionization chamber, wherein the inner surfaces of the chamber are formed from molybdenum to reduce adsorption, degradation and decomposition of an analyte and to reduce adverse ion/surface reactions is disclosed. A method of reducing adsorption, degradation and decomposition of an analyte and reducing adverse ion/surface reactions in an ionization source containing a chemical ionization chamber of a mass spectrometer including the step of forming the inner surfaces of the chamber from molybdenum is also disclosed. The inner surfaces may formed from molybdenum by constructing the entire chamber or the inner surfaces of the chamber from molybdenum; by depositing, plating or coating molybdenum on the inner surfaces of the chamber; or by a combination thereof. Suitable forms of molybdenum include solid molybdenum, mixtures containing at least 10% by weight molybdenum, and reaction products containing molybdenum.

Abstract: Multipole technology is used generally for charged particle optics which includes separating, focusing, or collimating "charged particles" (i.e., ions, electrons, etc.). A primary application of multipole technology is mass filters and particularly quadrupole mass filters. A quadrupole mass filter has a quadrupole substrate having four poles, each having a generally hyperbolic cross section, and interconnected by bridges. The bridges have apertures that facilitate the construction of poles inside the quadrupole substrate and prevent the build-up of unwanted charge. A plating substrate for electroplating is bonded to each pole substrate with a thin-film adhesion layer. Poles are electroplated upon these plating substrates. A diffusion barrier layer prevents the portions of the plating substrates from migrating to the quadrupole substrate where they would undermine the thin-film adhesion layer.