Patents by Inventor Charlie Reading

Charlie Reading has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for manufacturing data indexing
    Patent number: 7583833
    Abstract: A method, apparatus, and a system for generating an index for storing data. A pattern associated with a first set of data is determined. The first set of data is stored. A determination is made as to whether the pattern associated with a second set of data corresponds to the pattern associated with the first set of data. An index associated with the first set of data is correlated to the second set of data in response to determining that the pattern associated with the second set of data corresponds to the pattern associated with the first set of data.
    Type: Grant
    Filed: January 27, 2006
    Date of Patent: September 1, 2009
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Michael G. McIntyre, Alex Bierwag, Charlie Reading, Alfredo V. Herrera
  • Method and apparatus for manufacturing data indexing
    Publication number: 20070179663
    Abstract: A method, apparatus, and a system for generating an index for storing data. A pattern associated with a first set of data is determined. The first set of data is stored. A determination is made as to whether the pattern associated with a second set of data corresponds to the pattern associated with the first set of data. An index associated with the first set of data is correlated to the second set of data in response to determining that the pattern associated with the second set of data corresponds to the pattern associated with the first set of data.
    Type: Application
    Filed: January 27, 2006
    Publication date: August 2, 2007
    Inventors: Michael McIntyre, Alex Bierwag, Charlie Reading, Alfredo Herrera
  • Device level identification methodology
    Patent number: 6063685
    Abstract: A method of identifying individual semiconductor devices with a unique inscription during the manufacturing process for the semiconductor devices. Each individual semiconductor device is marked during a final lithographic stepping exposure with a direct write laser mounted either in the stepper in the lithographic system working concurrently with the stepping fields during the final metal layer lithographic stepping exposure or during a post stepping pre-development treatment. The marking on the devices includes device identification, lot number and die number.
    Type: Grant
    Filed: August 7, 1998
    Date of Patent: May 16, 2000
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Paul J. Steffan, Michael McIntyre, Charlie Reading