Patents by Inventor Charlotte C. Kwong

Charlotte C. Kwong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Manufacturing advanced test probes
    Patent number: 10627427
    Abstract: Embodiments relate to the formation of test probes. One method includes providing a bulk sheet of an electrically conductive material. A laser is used to cut through the bulk sheet in a predetermined pattern to form a test probe. Other embodiments are described and claimed.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: April 21, 2020
    Assignee: INTEL CORPORATION
    Inventors: Roy E. Swart, Paul B. Fischer, Charlotte C. Kwong
  • MANUFACTURING ADVANCED TEST PROBES
    Publication number: 20180045760
    Abstract: Embodiments relate to the formation of test probes. One method includes providing a bulk sheet of an electrically conductive material. A laser is used to cut through the bulk sheet in a predetermined pattern to form a test probe. Other embodiments are described and claimed.
    Type: Application
    Filed: October 26, 2017
    Publication date: February 15, 2018
    Inventors: Roy E. SWART, Paul B. FISCHER, Charlotte C. KWONG
  • Test probe structures and methods including positioning test probe structures in a test head
    Patent number: 9279830
    Abstract: The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.
    Type: Grant
    Filed: December 31, 2011
    Date of Patent: March 8, 2016
    Assignee: Intel Corporation
    Inventors: Roy E. Swart, Warren S. Crippen, Charlotte C. Kwong, David Shia
  • MANUFACTURING ADVANCED TEST PROBES
    Publication number: 20150008950
    Abstract: Embodiments relate to the formation of test probes. One method includes providing a bulk sheet of an electrically conductive material. A laser is used to cut through the bulk sheet in a predetermined pattern to form a test probe. Other embodiments are described and claimed.
    Type: Application
    Filed: December 31, 2011
    Publication date: January 8, 2015
    Inventors: Roy E. Swart, Paul B. Fischer, Charlotte C. Kwong
  • TEST PROBES
    Publication number: 20140239995
    Abstract: The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.
    Type: Application
    Filed: December 31, 2011
    Publication date: August 28, 2014
    Inventors: Roy E. Swart, Warren S. Crippen, Charlotte C. Kwong, David Shia