Abstract: A ring oscillator includes (2N+1) inverting delay circuit cells, and each delay circuit cell has an input port and an output port, where N is an integer larger than zero. Each of these (2N+1) inverting delay circuit cells receives a control voltage, and all of the (2N+1) inverting delay circuit cells are electrically connected with each other in series. Furthermore, the input port of one of the (2N+1) inverting delay circuit cells is electrically connected with the output port of an adjacent delay circuit cell of the (2N+1) inverting delay circuit cells.

Abstract: A chip-to-chip multi-signaling communication system with common conductive layer, which comprises a first chip, a second chip, and a common conductive layer, is disclosed. The first chip has at least a first metal pad and a second metal pad. The second chip has at least a first metal pad and a second metal pad. The common conductive layer is to a conductive material and glued directly to the first chip and the second chip. Wherein, the first metal pad of the second chip is aligned with the first metal pad of the first chip for receiving the signal from the first metal pad of the first chip through the common conductive layer. The interference generated by other pads of the first and the second chips is suppressed by the design of the pads and the common conductive layer.

Abstract: A ring oscillator includes (2N+1) inverting delay circuit cells, and each delay circuit cell has an input port and an output port, where N is an integer larger than zero. Each of these (2N+1) inverting delay circuit cells receives a control voltage, and all of the (2N+1) inverting delay circuit cells are electrically connected with each other in series. Furthermore, the input port of one of the (2N+1) inverting delay circuit cells is electrically connected with the output port of an adjacent delay circuit cell of the (2N+1) inverting delay circuit cells.

Abstract: A chip-to-chip multi-signaling communication system with common conductive layer, which comprises a first chip, a second chip, and a common conductive layer, is disclosed. The first chip has at least a first metal pad and a second metal pad. The second chip has at least a first metal pad and a second metal pad. The common conductive layer is to a conductive material and glued directly to the first chip and the second chip. Wherein, the first metal pad of the second chip is aligned with the first metal pad of the first chip for receiving the signal from the first metal pad of the first chip through the common conductive layer. The interference generated by other pads of the first and the second chips is suppressed by the design of the pads and the common conductive layer.

Abstract: A signal delay circuit including a capacitive load element is described. The capacitive load element has a first input end, a second input end, and a third input end. The first input end receives a first signal, the second input end receives a second signal inverted to the first signal, and the third input end receives a control signal. The capacitance of the capacitive load element changes with the control signal.

Abstract: A jitter measurement circuit and a method for calibrating the jitter measurement circuit are disclosed. The jitter measurement circuit includes a synchronous dual-phase detector and a decision circuit. In a test mode, a probability distribution function (PDF) of the jitter of a clock signal output by a circuit under test is obtained. In a calibration mode, a random clock, which is externally generated or generated by a free-run oscillator in the circuit under test, is used to calibrate the synchronous dual-phase detector. The decision circuit performs logic operations, data latching and counting on a phase relationship detected by the synchronous dual-phase detector in order to obtain a counting value and a PDF relative to the jitter of the clock signal.

Abstract: An oscillation circuit induces a first inverter, a second inverter, a first inductive load, a second inductive load and a capacitive load. A first inverter and a second inverter receive a first signal and a second signal, and invert the first and the second signal to output a first inverted signal and a second inverted signal respectively. An output end of the first inverter is electrically connected to a first inductive load, and an output end of the second inverter is electrically connected to a second inductive load. Further, a capacitive load is electrically connected to the output end of the first inverter and the output end of the second inverter, so as to receive the first and the second inverted signal respectively. The capacitance of the capacitive load changes with a control signal.

Abstract: A signal delay circuit including a capacitive load element is described. The capacitive load element has a first input end, a second input end, and a third input end. The first input end receives a first signal, the second input end receives a second signal inverted to the first signal, and the third input end receives a control signal. The capacitance of the capacitive load element changes with the control signal.

Abstract: A jitter measurement circuit and a method for calibrating the jitter measurement circuit are disclosed. The jitter measurement circuit includes a synchronous dual-phase detector and a decision circuit. In a test mode, a probability distribution function (PDF) of the jitter of a clock signal output by a circuit under test is obtained. In a calibration mode, a random clock, which is externally generated or generated by a free-run oscillator in the circuit under test, is used to calibrate the synchronous dual-phase detector. The decision circuit performs logic operations, data latching and counting on a phase relationship detected by the synchronous dual-phase detector in order to obtain a counting value and a PDF relative to the jitter of the clock signal.

Abstract: Disclosed is a sample and hold circuit for detecting a parameter of a data signal, which includes: a first switching module, wherein the sample and hold circuit samples the data signal according to the turning on or off of the first switching module; at least one capacitor, coupled to the first switching module; a second switching module, coupled to the capacitor; a controllable reference voltage source, for providing a first reference voltage to charge/discharge the capacitor via the second switching module according to a control signal; a first comparator, coupled to the capacitor, for comparing a voltage drop on the capacitor and the first reference voltage to generate a first comparing result; and a control circuit, coupled to the controllable reference voltage source and the first comparator, for generating the control signal according to the comparing results.

Abstract: Disclosed is a sample and hold circuit for detecting a parameter of a data signal, which includes: a first switching module, wherein the sample and hold circuit samples the data signal according to the turning on or off of the first switching module; at least one capacitor, coupled to the first switching module; a second switching module, coupled to the capacitor; a controllable reference voltage source, for providing a first reference voltage to charge/discharge the capacitor via the second switching module according to a control signal; a first comparator, coupled to the capacitor, for comparing a voltage drop on the capacitor and the first reference voltage to generate a first comparing result; and a control circuit, coupled to the controllable reference voltage source and the first comparator, for generating the control signal according to the comparing results.

Abstract: In a precisely self-calibrating high-speed analog to digital converter the aspect ratios of tri-state inverters are adjusted to fine-tune threshold voltage as comparators. And the multiplexers composed of tri-state inverters amplify the signal from the output of comparators. Their switches of tri-state inverters may be properly controlled to select the optimal channels and reduce unnecessary power consumption. The calibration circuitry utilizes under-sampling to calculate the duty cycles of comparators, selecting the optimal comparators and channels. By the way, the invention may avoid process variation.

Abstract: An oscillation circuit induces a first inverter, a second inverter, a first inductive load, a second inductive load and a capacitive load. A first inverter and a second inverter receive a first signal and a second signal, and invert the first and the second signal to output a first inverted signal and a second inverted signal respectively. An output end of the first inverter is electrically connected to a first inductive load, and an output end of the second inverter is electrically connected to a second inductive load. Further, a capacitive load is electrically connected to the output end of the first inverter and the output end of the second inverter, so as to receive the first and the second inverted signal respectively. The capacitance of the capacitive load changes with a control signal.

Abstract: A system for clock and data recovery (“CDR”) includes a clock generator, a half-rate phase detector for receiving the input data, an encoder, a phase selector outputting recovered clock, a confidence counter, and a multiplexer outputting recovered data. The clock generator generates an 8-phase clock signal at half a rate of the transmitted serial data. The phase detector samples input data at four times the standard sampling rate, takes the oversampled data and detects phase transitions therein, i.e., phase lead and lag. The encoder encodes the phase transition data. The confidence counter receives the phase transition data and generates a signal representing the accumulated net effect of the phase transitions. The phase selector receives the confidence counter signal and the 8-phase clock from the clock generator, and determines the optimum phase for data sampling.

Abstract: A precisely self-calibrating high-speed analog to digital converter is disclosed, wherein the aspect ratios of tri-state inverters are adjusted to fine-tune threshold voltage as comparators. And the multiplexers composed of tri-state inverters amplify the signal from the output of comparators. Their switches of tri-state inverters may be properly controlled to select the optimal channels and reduce unnecessary power consumption. The calibration circuitry utilizes under-sampling to calculate the duty cycles of comparators, selecting the optimal comparators and channels. By the way, the invention may avoid process variation.

Abstract: A system for clock and data recovery (“CDR”) includes a clock generator, a half-rate phase detector for receiving the input data, an encoder, a phase selector outputting recovered clock, a confidence counter, and a multiplexer outputting recovered data. The clock generator generates an 8-phase clock signal at half a rate of the transmitted serial data. The phase detector samples input data at four times the standard sampling rate, takes the oversampled data and detects phase transitions therein, i.e., phase lead and lag. The encoder encodes the phase transition data. The confidence counter receives the phase transition data and generates a signal representing the accumulated net effect of the phase transitions. The phase selector receives the confidence counter signal and the 8-phase clock from the clock generator, and determines the optimum phase for data sampling.

Abstract: A measuring method and system for liquid crystal display driver chips applies a new method to measure voltages of driver chips, and utilizes probability and statistics for analysis and determination so as to yield a rather accurate effect even under noisy environments. Accordingly, analog-to-digital converters can be replaced for faster sampling. The measuring method and system can be implemented using comparator circuits or pin electronics cards so that the measuring procedure for driver chips is simplified. Measured results are analyzed and verified by application of probability and statistics. As such, testing of liquid crystal display driver chips is more accurate, testing time is reduced, and accuracy level is promoted.

Abstract: A measuring method and system for liquid crystal display driver chips applies a new method to measure voltages of driver chips, and utilizes probability and statistics for analysis and determination so as to yield a rather accurate effect even under noisy environments. Accordingly, analog-to-digital converters can be replaced for faster sampling. The measuring method and system can be implemented using comparator circuits or pin electronics cards so that the measuring procedure for driver chips is simplified. Measured results are analyzed and verified by application of probability and statistics. As such, testing of liquid crystal display driver chips is more accurate, testing time is reduced, and accuracy level is promoted.

Abstract: A sampling timing recovering circuit free from being troubled by a frequency error is provided. Such recovering circuit includes a phase locking circuit having a local frequency for processing an incoming signal having a phase, a specific parameter and an input symbol rate and for locking the phase of the incoming signal, and a frequency locking circuit electrically connected to the phase locking circuit for locking the input symbol rate of the incoming signal to enable the phase locking circuit to desiredly process the incoming signal. A method to this effect is also provided and includes the steps of a) processing an incoming signal having a phase, a specific parameter and an input symbol rate to have the phase lockable, b) locking the phase of the incoming signal, and c) locking the input symbol rate of the incoming signal to enable the incoming signal to be predeterminedly processed.

Abstract: A timing generating apparatus includes a master timing module adapted to receive an external reference clock and to generate a coarse timing pulse signal. A slave timing module is coupled electrically to the master timing module and receives the coarse timing pulse signal, from which a fine timing pulse signal is generated. A calibration module coupled electrically to the master timing module and the slave timing module receives the coarse timing pulse signal and the fine timing pulse signal, determines a phase difference value between the two, and generates a phase compensation signal corresponding to difference between the phase difference value and a predetermined phase difference value. The slave timing module includes a delay control unit and a voltage-controlled delay unit, which introduce a phase delay into the coarse timing pulse signal so as to generate the fine timing pulse signal.