Patents by Inventor Chay Goldenberg

Chay Goldenberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12320758
    Abstract: A method for inspection of multiple features of patterned objects in the manufacture of electrical circuits, the method including performing defect detection on the patterned object, employing an optical defect detection machine (ODDM) and employing the ODDM to measure at least one of spatial coordinates and physical attributes of at least some of the multiple features.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: June 3, 2025
    Assignee: Orbotech Ltd.
    Inventors: Vered Gatt, Itzhak Saki Hakim, Chay Goldenberg, Mordehay Amirim
  • Publication number: 20250137938
    Abstract: A method for inspection of multiple features of patterned objects in the manufacture of electrical circuits, the method including performing defect detection on the patterned object, employing an optical defect detection machine (ODDM) and employing the ODDM to measure at least one of spatial coordinates and physical attributes of at least some of the multiple features.
    Type: Application
    Filed: December 24, 2024
    Publication date: May 1, 2025
    Inventors: Vered Gatt, Itzhak Saki Hakim, Chay Goldenberg, Mordehay Amirim
  • Publication number: 20240378716
    Abstract: A method for 3D imaging of samples using a machine learning algorithm is disclosed. The method uses multimodality focal stacks, which consist of a plurality of images acquired at two or more distances between the sample and a front focal plane, with at least one image acquired using the first modality and additional images acquired using additional modalities. The modalities may have different illumination angles and optionally different spectral distributions. The method may include receiving training images of samples, which include a plurality of training focal stacks, and ground truth 3D data (depth maps) for each training focal stack, and training a machine learning algorithm based on the training images and the ground truth data. The method subsequently receives product images of a sample, the product images including a focal stack from an optical assembly, and generates a 3D depth map.
    Type: Application
    Filed: May 9, 2023
    Publication date: November 14, 2024
    Inventor: Chay Goldenberg
  • Publication number: 20230105983
    Abstract: A method for inspection of multiple features of patterned objects in the manufacture of electrical circuits, the method including performing defect detection on the patterned object, employing an optical defect detection machine (ODDM) and employing the ODDM to measure at least one of spatial coordinates and physical attributes of at least some of the multiple features.
    Type: Application
    Filed: December 29, 2020
    Publication date: April 6, 2023
    Inventors: Vered Gatt, Itzhak Saki Hakim, Chay Goldenberg, Mordehay Amirim
  • Patent number: 11159712
    Abstract: A range differentiator useful for auto-focusing, the range differentiator including an image generator providing an image of a scene at various physical depths, a depth differentiator distinguishing portions of the image at depths below a predetermined threshold, irrespective of a shape of the portions, and providing a depth differentiated image and a focus distance ascertainer ascertaining a focus distance based on the depth differentiated image.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: October 26, 2021
    Assignee: Orbotech Ltd.
    Inventors: Shai Wiseman, Yigal Katzir, Ofir Shnit, Ilia Lutsker, Chay Goldenberg
  • Publication number: 20190266693
    Abstract: A range differentiator useful for auto-focusing, the range differentiator including an image generator providing an image of a scene at various physical depths, a depth differentiator distinguishing portions of the image at depths below a predetermined threshold, irrespective of a shape of the portions, and providing a depth differentiated image and a focus distance ascertainer ascertaining a focus distance based on the depth differentiated image.
    Type: Application
    Filed: February 22, 2019
    Publication date: August 29, 2019
    Applicant: Orbotech Ltd.
    Inventors: Shai WISEMAN, Yigal Katzir, Ofir Shnit, Ilia Lutsker, Chay Goldenberg