Abstract: A zoom spotlight has a reflector, a light source, a fixed lens, and a movable lens. The movable lens of the zoom spotlight can be moved and thereby adjusted in position relative to the fixed lens so that the zoom spotlight can output a broad beam, a collimated beam, or a beam ranging between the broad beam and the collimated beam, according to the user's needs.

Abstract: The present invention discloses a microscopy imaging structure with phase conjugated mirror and the method thereof. The afore-mentioned imaging structure produces a reverse focusing conjugated probe beam together with an original probe beam. These two probe beams meet at the focal point in the object body to be probed, and an interference pattern is produced. The interval between any two consecutive wave fronts in the interference pattern is then half of the wavelength of the original probe beam, and hence the vertical resolution of the image is improved. The present invention also applies a light modulator module on the probe beam to easily adjust the depth of the focal point of the probe beam and the phase conjugated reverse focusing probe beam in the object body. With the adoption of this invention, the size or position limitation of the target object is eliminated and the imaging resolution is also improved.

Abstract: A detecting system for detecting an under-test light of an under-test object includes a light spatial distribution unit, a chromatic-dispersion light-splitting unit and a detecting unit. The light spatial distribution unit is disposed on a side of the under-test object to receive the under-test light and form a plurality of point light sources. The chromatic-dispersion light-splitting unit is disposed on a side of the light spatial distribution unit to receive the point light sources and produce a light-splitting signal. The detecting unit is disposed on a side of the chromatic-dispersion light-splitting unit to receive the light-splitting signal and produce an optical field distribution of the under-test light.

Abstract: A light interference module includes an object lens, a first light-guiding element, and a second light-guiding element. The object lens is configured to project a signal light beam to an optical storage media. The first light-guiding element is configured to project a first reference light beam to the optical storage media, in which the first reference light beam and the signal light beam produce a first interference pattern on the optical storage media. The second light-guiding element is configured to project a second reference light beam to the optical storage media, in which the second reference light beam and the signal light beam produce a second interference pattern on the optical storage media, and the first interference pattern is different from the second interference pattern.

Abstract: A zoom spotlight has a reflector, a light source, a fixed lens, and a movable lens. The movable lens of the zoom spotlight can be moved and thereby adjusted in position relative to the fixed lens so that the zoom spotlight can output a broad beam, a collimated beam, or a beam ranging between the broad beam and the collimated beam, according to the user's needs.

Abstract: A light interference module includes an object lens, a first light-guiding element, and a second light-guiding element. The object lens is configured to project a signal light beam to an optical storage media. The first light-guiding element is configured to project a first reference light beam to the optical storage media, in which the first reference light beam and the signal light beam produce a first interference pattern on the optical storage media. The second light-guiding element is configured to project a second reference light beam to the optical storage media, in which the second reference light beam and the signal light beam produce a second interference pattern on the optical storage media, and the first interference pattern is different from the second interference pattern.

Abstract: A detecting system for detecting an under-test light of an under-test object includes a light spatial distribution unit, a chromatic-dispersion light-splitting unit and a detecting unit. The light spatial distribution unit is disposed on a side of the under-test object to receive the under-test light and form a plurality of point light sources. The chromatic-dispersion light-splitting unit is disposed on a side of the light spatial distribution unit to receive the point light sources and produce a light-splitting signal. The detecting unit is disposed on a side of the chromatic-dispersion light-splitting unit to receive the light-splitting signal and produce an optical field distribution of the under-test light.

Abstract: The present invention discloses a microscopy imaging structure with phase conjugated mirror and the method thereof. The afore-mentioned imaging structure produces a reverse focusing conjugated probe beam together with an original probe beam. These two probe beams meet at the focal point in the object body to be probed, and an interference pattern is produced. The interval between any two consecutive wave fronts in the interference pattern is then half of the wavelength of the original probe beam, and hence the vertical resolution of the image is improved. The present invention also applies a light modulator module on the probe beam to easily adjust the depth of the focal point of the probe beam and the phase conjugated reverse focusing probe beam in the object body. With the adoption of this invention, the size or position limitation of the target object is eliminated and the imaging resolution is also improved.