Patents by Inventor Che-Sheng Cheng

Che-Sheng Cheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method of building test file
    Patent number: 11573886
    Abstract: A device for building a test file comprises a receiving module, for receiving a first request of a first user and for analyzing the first request, and for notifying an analysis result of the first request to the first user; a building module, coupled to the receiving module, for building the test file according to the first request of a task queue; and a transmitting module, coupled to the building module, for notifying a building result of the test file to the first user.
    Type: Grant
    Filed: August 2, 2021
    Date of Patent: February 7, 2023
    Assignees: Inventec (Pudong) Technology Corp., Inventec Corporation
    Inventors: Che-Sheng Cheng, Yen-Chen Chuang, Kuo-Hsin Hsu
  • Device and Method of Building Test File
    Publication number: 20220391307
    Abstract: A device for building a test file comprises a receiving module, for receiving a first request of a first user and for analyzing the first request, and for notifying an analysis result of the first request to the first user; a building module, coupled to the receiving module, for building the test file according to the first request of a task queue; and a transmitting module, coupled to the building module, for notifying a building result of the test file to the first user.
    Type: Application
    Filed: August 2, 2021
    Publication date: December 8, 2022
    Applicants: Inventec (Pudong) Technology Corp., Inventec Corporation
    Inventors: Che-Sheng Cheng, Yen-Chen Chuang, Kuo-Hsin Hsu
  • AUTOMATIC TEST METHOD FOR RELIABILITY AND FUNCTIONALITY OF ELECTRONIC DEVICE
    Publication number: 20210072301
    Abstract: An automatic test method for reliability and functionality of electronic device is provided to deploy a robotic arm to perform reliability test on a tested component. In the meantime, the test host can directly access the generic log files generated by the tested electronic device without the need of using a third-party test utility on the tested electronic device. Analysis is carried out by the test host using the log files to determine whether each test round generates functional result to the tested component so that data of the functionality can be collected.
    Type: Application
    Filed: September 16, 2019
    Publication date: March 11, 2021
    Inventors: Chin-Lin Hsieh, Yu-Ting Weng, Che-Cheng Wang, Che-Sheng Cheng
  • Test method for built-in memory in computer device
    Patent number: 10811115
    Abstract: A test method for testing a built-in memory in a computer device includes the following operations. The built-in memory is tested by a test function of a basic input/output system (BIOS) in the computer device to create a data file. An analysis application is performed by a test device to analyze the data file. According to analyzing the data file, an abnormal memory chip is determined whether to exist in the built-in memory. The data file includes test data of memory chips in the built-in memory.
    Type: Grant
    Filed: June 13, 2019
    Date of Patent: October 20, 2020
    Assignees: Inventec (Pudong) Technology Corporation, INVENTEC CORPORATION
    Inventors: Tzu-Pin Wang, Kuo-Hsin Hsu, I-Ting Liu, Che-Sheng Cheng