Patents by Inventor Chea-Ok KO

Chea-Ok KO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for measuring integrated circuit current and method of measuring integrated circuit current using the device
    Patent number: 10401397
    Abstract: A method of extracting an Integrated Circuit (IC) current is provided. The method includes generating a transfer function value by using a voltage measured in a node nearest an input terminal of the IC, substituting the generated transfer function value for a reverse fast Fourier transform function, so as to extract the IC voltage, and extracting the IC current from the extracted IC voltage through a simulation in a time domain.
    Type: Grant
    Filed: February 6, 2014
    Date of Patent: September 3, 2019
    Assignee: Samsung Electronics Co., Ltd
    Inventors: Sang-Ho Lim, Sang-Ho Lee, Chea-Ok Ko, Jong-Wan Shim, Jeong-Nam Cheon
  • DEVICE FOR MEASURING INTEGRATED CIRCUIT CURRENT AND METHOD OF MEASURING INTEGRATED CIRCUIT CURRENT USING THE DEVICE
    Publication number: 20140222360
    Abstract: A method of extracting an Integrated Circuit (IC) current is provided. The method includes generating a transfer function value by using a voltage measured in a node nearest an input terminal of the IC, substituting the generated transfer function value for a reverse fast Fourier transform function, so as to extract the IC voltage, and extracting the IC current from the extracted IC voltage through a simulation in a time domain.
    Type: Application
    Filed: February 6, 2014
    Publication date: August 7, 2014
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Sang-Ho LIM, Sang-Ho LEE, Chea-Ok KO, Jong-Wan SHIM, Jeong-Nam CHEON